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Displaying 57751 - 57775 of 74189

On-Wafer Impedance Measurement on Lossy Substrates

June 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
This paper introduces a new method for measuring impedance parameters in transmission lines fabricated on lossy or dispersive dielectrics. The method, which uses an independent calibration to provide an impedance reference, compares well with conventional

Report of the NIST Workshop on Key Escrow Encryption

June 1, 1994
Author(s)
A Oldehoeft, Dennis K. Branstad
On June 10, 1994, the National Institute of Standards and Technology (NIST) hosted a one-day workshop to present and discuss key escrow encryption technology, including the recently-approved Escrowed Encryption Standard (EES), Federal Information
Displaying 57751 - 57775 of 74189
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