Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts

Published

Author(s)

Alain C. Diebold, M. Kump, Joseph Kopanski, David G. Seiler
Proceedings Title
Extended Abstracts of the Electrochemical Society
Volume
94-33
Conference Dates
October 9-14, 1994
Conference Location
Miami, FL, USA

Citation

Diebold, A. , Kump, M. , Kopanski, J. and Seiler, D. (1994), Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts, Extended Abstracts of the Electrochemical Society, Miami, FL, USA (Accessed June 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1994, Updated October 12, 2021