NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 40951 - 40975 of 73697

Electron Beam Metrology of 193 nm Resists at Ultra Low Voltage

May 1, 2003
Author(s)
N. Sullivan, Ronald G. Dixson, B Bunday, M Mastovich, P Knutruda, P Fabre, R Brandoma
Resist slimming under electron beam exposure introduces significant measurement uncertainty in the metrology of 193 nm resists. Total critical dimension (CD) uncertainty of up to 10 nm can arise from line slimming through a combination of the line slimming

Electron Self-Energy Calculation Using a General Multi-Pole Approximation

May 1, 2003
Author(s)
J A. Soininen, J J. Rehr, Eric L. Shirley
We present a method for calculating the inverse of the dielectric matrix in a solid using a Band-Lanczos algorithm. The method produces a multi-pole approximation for the inverse dielectrix matrix with an arbitrary number of poles. We discuss how this

Fingerprint Interoperability Standards

May 1, 2003
Author(s)
R. McCabe
The commercialization of the Automatic Fingerprint Identification System (AFIS) began in the mid 1970s with the installation of five systems at the FBI. In subsequent years, additional vendors developed competing AFISs without considering any aspects of

Fluctuating Field Calculations for a Bimodal Medium

May 1, 2003
Author(s)
S Rao, Lawrence H. Bennett, Edward Della Torre, P J. Chen, R A. Fry
Bimodal magnetic behavior, has been observed in a multilayer film. In that film the Kerr rotation and ellipticity exhibit magneto-optic hystersis loops with two distinct field dependent steps so that there are four stable magnetization states. The magnetic

GLUT/Tk: Open GL with Tcl/Tk

May 1, 2003
Author(s)
Joseph Konczal
GLUT/Tk provides a mechanism for control of 3D graphics applications by a full-featured GUI system. It connects control windows written in Tk to OpenGL graphics windows managed by GLUT, with minimal disruption of each package's default program structure

Hierarchical Restoration Scheme for Multiple Failures in GMPLS Networks

May 1, 2003
Author(s)
San-Nan K. Lee, C Kim, David W. Griffith
It is expected that GMPLS-based recovery could become a viable option for obtaining faster restoration than layer 3 rerouting. Even though dedicated restoration ensures restorability of connections, exclusive use of dedicated scheme would result in wasting

IEEE TC-10: What's It All About?

May 1, 2003
Author(s)
Thomas E. Linnenbrink, W. B. Boyer, Nicholas Paulter, S. J. Tilden
The IEEE TC-10 comprises three working groups that have or are generating standards related to the measurement of signals. One of these groups has recently completed the IEEE Std. 1241, "Standard for Terminology and Test Methods for Analog-to-Digital

Implementation of a Reference Measurement System Using CD-AFM

May 1, 2003
Author(s)
Ronald G. Dixson, Theodore V. Vorburger, Angela Guerry, Marylyn H. Bennett, B Bunday
International SEMATECH (ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of atomic force microscope (AFM) dimensional metrology in semiconductor manufacturing. The rapid pace of

Influence of Cross-link Density on the Thermal Properties of Thin Polymer Network Films

May 1, 2003
Author(s)
Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Wen-Li Wu
Cross-linked epoxy network films were cast onto silicon wafers with a variety of surface treatments. X-ray reflectivity was used to characterize their electron density and thermal expansion in the rubbery state. A transition from bulk to confined expansion

Intermixing of Aluminum-Magnetic Transition Metals Bilayers

May 1, 2003
Author(s)
J D. Buchanan, T P. Hase, B K. Tanner, P J. Chen, L Gan, Cedric J. Powell, William F. Egelhoff Jr.
Grazing incidence x-ray scattering has been used to study interfacial intermixing in thin films of aluminum/transition metal bilayers grown by dc magnetron sputter deposition at room temperature. As with all transition metals, the ferromagnets Fe, Co and

Introducing Material Dispersion in ADI-FDTD

May 1, 2003
Author(s)
Shawn W. Staker, Christopher L. Holloway, Melinda Piket-May
This paper presents the incorporation of material dispersion into ADI-FDTD, ADI-FDTD is an uncontionally stable mathod, allowing the time step to be increased beyond the CFL bound. ADI class problems result in a reduced execution time, while maintaining

Ion Optical Clocks and Quantum Information Processing

May 1, 2003
Author(s)
David J. Wineland, James C. Bergquist, Till P. Rosenband, Piet Schmidt, Wayne M. Itano, John J. Bollinger, Dietrich G. Leibfried, W Oskay
We summarize experiments at NIST that (1) use guantum gates to entabgle ions and thereby improve the measurement signal-to-noise ratio in spectroscopy and (2) implement sympathetic cooling and quantum state transfer techniques, which might be used to

Luminance probes for contrast measurements in medical displays

May 1, 2003
Author(s)
Aldo Badano, Scott Pappada, Edward F. Kelley, Michael J. Flynn, Sandrine Martin, Jerzy Kanicki
We report on a comparative study that examines four conic luminance probes in their ability to measure small-spot display contrast. We performed linear scans of a slit using a computer-controlled stage. We found that, although the probes were assembled

Magnetic and Structural Characterization and Ferromagnetic Resonance Study of Thin Film HITPERM Soft Magnetic Materials for Data Storage Applications

May 1, 2003
Author(s)
Hideyuki Okumura, D J. Twisselmann, Robert McMichael, M Q. Huang, Y N. Hsu, D E. Laughlin, M E. McHenry
HITPERM/SiO 2 single and multilayer thin films have been produced using a target composition of (Fe 70Co 30) 88}Zr 7}B 4}Cu 1}. The as-deposited HITPERM film contains small bcc (or B2) nanocrystals of volume fraction less than 10% surrounded by an
Displaying 40951 - 40975 of 73697
Was this page helpful?