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NIST Authors in Bold

Displaying 40976 - 41000 of 73697

Manufacturing Interoperability

May 1, 2003
Author(s)
Steven R. Ray, Albert T. Jones
As manufacturing and commerce become ever more global in nature, companies are increasingly dependent upon the efficient and effective exchange of information with their partners, wherever they may be. Leading manufacturers rely upon computers to perform

Measurements of the Infrared Absorption Cross-Sections of Haloalkanes and Their Use in a Simplified Calculational Approach for Estimating Direct Global Warming Potentials

May 1, 2003
Author(s)
Vladimir L. Orkin, A G. Guschin, I K. Larin, Robert E. Huie, Michael J. Kurylo III
The infrared absorption cross-sections and integrated band intensities for 21 haloakanes: CFCl 3, CF 2Cl 2, CF 2Br 2, CH 2F 2, CHR 2Cl, CHF 2Br, CF 3Br, CHCl 2-CF 2Cl, CHFCl-CFCl 2, CHCl 2-CF 3, CHClBr-Cf 3, CHFCl-CFd2^Cl, CHFBr-CF 3, CHF 2-CF 3, CH 2Br-CF

Metrics and Metrology for FPDs

May 1, 2003
Author(s)
Edward F. Kelley
We review various methods for making optical measurements of flat panel displays (FPDs). In particular, the measurements outlined in the VESA FPDM2 will be featured. Special attention is given to difficulties in implementing the methods.

Microscopic Structure of a Vortex Line in a Dilute Superfluid Fermi Gas

May 1, 2003
Author(s)
N Nygaard, G M. Bruun, Charles W. Clark, D L. Feder
The microscopic properties of a single vortex in a dilute superfluid Fermi gas at zero temperature are examined within the framework of self-consistent Bogoliubov-de Gennes theory. Using only physical parameters as inputwe study the pair potential, the

Modeling Superconformal Electrodeposition Using the Level Set Method

May 1, 2003
Author(s)
Daniel Wheeler, Daniel Josell, Thomas P. Moffat
Superconformal filling (superfill) occurs when a high aspect ratio feature on a silicon wafer fills due to preferential metal deposition on the bottom surface that permits it to escape before deposition on the side walls causes them to close off. This

Near the Static Fatigue Limit in Glass

May 1, 2003
Author(s)
Sheldon M. Wiederhorn, A Dretzke, J Rodel
The atomic force microscope is used to explore the nature of fracture surfaces in soda lime silicate glass formed near or below the apparent crack growth threshold. Conventional theory suggests that cracks in glass will blunt when subjected to stresses

Network Provisioning as a Game Against Nature

May 1, 2003
Author(s)
Vladimir V. Marbukh
Traditional approaches to network provisioning assume availability of the reliable estimates for the expected demands. This assumption, however, oversimplifies many practical situations when some incomplete information on the expected demands is available

New Method to Enhance Overlay Tool Performance

May 1, 2003
Author(s)
Ravikiran Attota, Richard M. Silver, Michael T. Stocker, Egon Marx, Jay S. Jun, M P. Davidson, Robert D. Larrabee
New methods to enhance and improve algorithm performance and data analysis are being developed at NIST for overlay measurement applications. Both experimental data and improved theoretical optical scattering models have been used for the study. We have

NIST Digital Library of Mathematical Functions

May 1, 2003
Author(s)
Daniel W. Lozier
NIST (formerly, National Bureau of Standards) has started an ambitious project that aims to produce a successor to Abramowitz and Stegun's {\em Handbook of Mathematical Functions}, published by the National Bureau of Standards in 1964 and reprinted by

Numerical Analysis of a Coaxial Line With a Complex Gap Capacitance

May 1, 2003
Author(s)
Jan Obrzut, O Anopchenko
A full wave numerical analysis was performed for a coaxial line terminated by a complex gap capacitance. The scattering parameters, input impedance and the spatial distribution of the electromagnetic field have been obtained in the frequency range of 100

On Shortest Random Walks under Adversarial Uncertainty

May 1, 2003
Author(s)
Vladimir V. Marbukh
Finding shortest feasible paths in a weighted graph has numerous applications including admission and routing in communication networks. This paper discusses a game theoretic framework intended to incorporate a concept of path stability into the process of

Orientation of Carbon Nanotubes in a Sheared Polymer Melt

May 1, 2003
Author(s)
Erik K. Hobbie, Haonan Wang, H W. Kim, Sheng Lin-Gibson, E A. Grulke
Optical measurements of the shear response of dilute ensembles of multi-walled carbon nanotubes dispersed in a polybutadiene melt are presented. At low shear stress, the measurements suggest that the tubes are broadly oriented along the direction of flow

Overlay Metrology Simulations: Analytical and Experimental Validations

May 1, 2003
Author(s)
Joel L. Seligson, B Golovanevsky, J M. Poplawski, M E. Adel, Richard M. Silver
We have previously reported on an overlay metrology simulation platform, used for modeling both the effects of overlay metrology tool behavior and the impact of target design on the ultimate metrology performance. Since our last report, the simulations by
Displaying 40976 - 41000 of 73697
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