Measurements of frequency dependence of fused-silica capacitors

Published

August 1, 2003

Author(s)

Yicheng Wang

Abstract

In order to improve the capacitance calibration services at the National Institute of Standards and Technology, we need to determine the frequency dependence of all the reference capacitance standards over the audio frequency range. The value of a standard capacitor may very slightly with frequency because the imperfect medium between its electrodes has varying degree of dielectric relaxation over the frequency range and the leads and electrodes of the capacitor have residual inductance. Using a combination of 1 pF cross capacitor that has negligible frequency dependence due to electrode surface films, and a 10 pF nitrogen dielectric capacitor with a very small residual inductance as references, we have measured the frequency dependence of two 10 pF transportable fused-silica capacitors from 50 Hz to 20 kHz. The results and the associated uncertainty analysis are discussed.

Conference Dates

August 17-21, 2003

Conference Location

Tampa, FL

Conference Title

NCSL International Workshop and Symposium

Pub Type

Conferences

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Keywords

calibration, capacitance, farad, frequency dependence, fused-silica capacitor, impedance, measurement, uncertainty

Citation

Wang, Y. (2003), Measurements of frequency dependence of fused-silica capacitors, NCSL International Workshop and Symposium, Tampa, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31333 (Accessed December 14, 2024)