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High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba2YCu3O6+x Films Using the BaF2 Conversion Process



Winnie K. Wong-Ng, Igor Levin, Mark D. Vaudin, Ron Feenstra, Lawrence P. Cook, James P. Cline


In-situ high-temperature x-ray diffraction (HTXRD) was used to study the phase formation and reaction kinetics of the Ba2Ycu3O6+x (Y-213) phase using the ex-situ BaF2 conversion process. Three sets of films on single crystal SrTiO3 substrates were prepared using e-beam co-evaporation technique of BaF2, Y and Cu targets. HTXRD studies were conducted on precursor films with thickness of 0.3 m and 1.0 m. The 0.3 m films showed mainly (00l) texture whereas the 1.0 m films showed a significant volume fraction of (h00) texture as well. A semi-quantitative estimate of the texture fraction was accomplished using the software TexturePlus. The growth of Y-213 and the consumption of BaF2 were found to beapproximately linear in time.
Advances In X-Ray Analysis


Ba<sub>2</sub>YCu<sub>3</sub>O <sub>6+x</sub> films, BaF<sub>2</sub> process, coated conductors, high-temperature x-ray diffraction, phase formation, texture


Wong-Ng, W. , Levin, I. , Vaudin, M. , Feenstra, R. , Cook, L. and Cline, J. (2003), High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba<sub>2</sub>YCu<sub>3</sub>O<sub>6+x</sub> Films Using the BaF<sub>2</sub> Conversion Process, Advances In X-Ray Analysis (Accessed April 23, 2024)
Created August 1, 2003, Updated January 31, 2018