Churilov, S.
, Joshi, Y.
and Reader, J.
(2003),
High Resolution Spectrum of Xenon Ions at 13.4 nm, Optics Letters
(Accessed December 14, 2024)
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High Resolution Spectrum of Xenon Ions at 13.4 nm
Published
Author(s)
S S. Churilov, Y N. Joshi,
Abstract
The spectrum of xenon excited in a low-inductance vacuum spark was photographed at high resolution in the region 9.5 nm - 15.5 nm. The observed transitions were identified as belonging to ions from Xe8+ to Xe13+. In the region of importance for EUV lithography around 13.4 nm, the strongest lines were identified as 4d8 -4d7 5p transitions in Xe10+. The identifications were made by using electronic energy parameters extrapolated along the isoelectronic sequence.Citation
Optics Letters
Volume
28
Issue
No. 16
Pub Type
Journals
Keywords
extreme ultraviolet, ions, microlithography, spectrum, wavelengths, xenon
Citation
Issues
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Created July 31, 2003, Updated October 12, 2021