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Displaying 35076 - 35100 of 74164

Nonlinearity of high-power optical fiber power meters at 1480 nm

February 20, 2006
Author(s)
Igor Vayshenker, Shao Yang, Ralph Swafford
We describe a calibration system that measures the nonlinearity of optical fiber power meters (OFPMs) at a maximum power of 0.6 W and a minimum power of 0.2 mW at 1480 nm. The system is based on the triplet superposition method. This system measures the

Simple Spectral Stray Light Correction Method for Array Spectroradiometers

February 20, 2006
Author(s)
Yuqin Zong, Steven W. Brown, Bettye C. Johnson, Keith R. Lykke, Yoshihiro Ohno
In many applications, the measurement accuracy of spectroradiometers, particularly instruments with a single dispersive element, is limited by the presence of stray radiation within the instrument. A simple, practical method has been developed to correct a

Dissolution Fundamentals of 193-nm Methacrylate Based Photoresists

February 19, 2006
Author(s)
Ashwin Rao, Shuhui Kang, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Karen Turnquest, W D. Hinsberg
The dissolution of partially deprotected chemically amplified photoresists is the final step in printing lithographic features. Since this process step can be tuned independently from the design of the photoresist chemistry, fundamental measurements of the

TREC: An Overview

February 17, 2006
Author(s)
Donna K. Harman, Ellen M. Voorhees
The Text REtrieval Conference (TREC) is a workshop series designed to build the infrastructure necessary for large-scale evaluation of text retrieval technology. Participants in the workshops (over 100 groups in the latest TREC) have been drawn from the

Phenomenology of Passive Broadband Terahertz Images

February 15, 2006
Author(s)
Charles Dietlein, A. Luukanen, Francois Meyer, Zoya Popovic, Erich N. Grossman
Images acquired by a 105-mK noise equivalent temperature difference (NETD) scanned single-pixel broadband 0.1-1 THz passive system are analyzed with two specific parameters of interest in mind. First, the minimum system noise level for clothing feature

Preliminary Face Recognition Grand Challenge Results

February 15, 2006
Author(s)
P J. Phillips, P J. Flynn, W T. Scruggs, K W. Bowyer, W Worek
The goal of the Face Recognition Grand Challenge (FRGC) is to improve the performance of face recognition algorithms by an order of magnitude over the best results in Face Recognition Vendor Test (FRVT) 2002. The FRGC is designed to achieve this

Terahertz circular variable filters

February 15, 2006
Author(s)
Erich N. Grossman, Charles Dietlein, A. Luukanen
We describe a novel class of millimeter-wave and terahertz monochrometers based on adiabatically tuned frequency-selective surfaces. They are analogous to the circular-variable filters commonly used in the infrared for low to moderate resolution

The Distillation and Volatility of Ionic Liquids

February 15, 2006
Author(s)
Martyn J. Earle, Jose M. Esperanca, Manuela A. Gilea, Luis P. Rebelo, Kenneth R. Seddon, Joe W. Magee, Jason A. Widegren
The distillation of a variety of ionic liquids is demonstrated for the first time. The distillations are performed at moderate to high temperatures and at reduced pressure.

High-resolution spectral hole burning in InGaAs/GaAs quantum dots

February 10, 2006
Author(s)
Joseph J. Berry, Martin Stevens, Richard Mirin, Kevin L. Silverman
We report the use of continuous wave spectral hole burning to perform high-resolution spectroscopy of the homogeneous linewidth of self-assembled InGaAs/GaAs quantum dots at low temperature. We use this technique to examine the power broadening behavior of

Optical Metrology for LEDs and Solid State Lighting

February 9, 2006
Author(s)
Yoshi Ohno
The performance of Light Emitting Diodes (LEDs), including efficiency, flux level, lifetime, and the variation of color, is advancing at a remarkable pace. LEDs are increasingly used for many applications including automotive, aviation, display

Development of a Color Quality Scale

February 8, 2006
Author(s)
Wendy L. Davis, Yoshihiro Ohno
A new metric for evaluating the color quality of light sources is being developed at NIST, in close contact with the lighting industry and the CIE. The current CIE Color Rendering Index (CRI) is outdated and has several known deficiencies. The CRI only

Energy Levels and Spectral Lines of Ne VII

February 8, 2006
Author(s)
Alexander Kramida, M-C Buchet-Poulizac
All experimental data on Ne VII, including previously unpublished beam-foil spectroscopy data, have been compiled and critically evaluated. More than a hundred spectral lines have been newly identified. For 40 transitions, the previous identifications have
Displaying 35076 - 35100 of 74164
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