NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Optical Metrology for LEDs and Solid State Lighting
Published
Author(s)
Yoshi Ohno
Abstract
The performance of Light Emitting Diodes (LEDs), including efficiency, flux level, lifetime, and the variation of color, is advancing at a remarkable pace. LEDs are increasingly used for many applications including automotive, aviation, display, transportation and special lighting applications. White LEDs are expected for general lighting applications (solid state lighting) in the near future. Thus, accurate measurements of LEDs and appropriate standards are increasingly important. This paper reviews photometric, radiometric, and colorimetric quantities used for LEDs, and discusses the current state of optical measurements of LEDs and standardization efforts in International Commission on Illumination (CIE). The paper also touches on the issue of color quality (e.g., Color Rendering Index) of light expected from solid state lighting, and the need for a new metric. The calibration facilities and services for LEDs established at NIST are also discussed.
Ohno, Y.
(2006),
Optical Metrology for LEDs and Solid State Lighting, Proceedings of the 5th Symposium, Queretaro, 1, MX, [online], https://doi.org/10.1117/12.674617, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840989
(Accessed October 11, 2025)