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NIST Authors in Bold

Displaying 10676 - 10700 of 13225

Recommended Objective Test Procedures for Road Departure Crash Warning Systems

January 6, 2006
Author(s)
Sandor S. Szabo, Richard J. Norcross
… the assistance of the National Institute of Standards and Technology (NIST), is devising test procedures that provide performance data in an objective and quantitative manner. These tests will … pace with the capabilities of the warning systems. In the long term, these tests may one-day become part of a …

SI Realization of Small Forces Using an Electrostatic Force Balance

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar
… We describe the realization of micronewton forces in a fashion consistent with the International System of … Units (SI) using the National Institute of Standards and Technology (NIST) electrostatic force balance. A comparison … measurements at a level consistent with the uncertainties in 20 mg mass artifacts. We provide a brief description of …

Status of the NIST 3D Imaging System Performance Evaluation Facility

January 1, 2006
Author(s)
Geraldine S. Cheok, Alan M. Lytle, Kamel S. Saidi
… Facility at the National Institute of Standards and Technology (NIST) for 3D imaging systems. This facility will … facility was initiated based on a workshop held at NIST in 2003 to determine the efforts towards standardizing 3D … March 2 3, 2006. These workshops provided further guidance in terms of priorities and the types of measurements that are …

Flexible Cryo-packages for Josephson Devices

June 1, 2005
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus, Yonuk Chong, Hirotake Yamamori
… flexible cryo-packages. This new 'flip-chip on flex' technology will greatly improve the service life and …

Stacked Niobium-MoSi 2 -Niobium Josephson Junctions for AC Voltage Standards

June 1, 2005
Author(s)
Paul Dresselhaus, Yonuk Chong, Samuel Benz
… (SNS) Josephson junctions have proven to be a critical technology for voltage standards. NIST has used SNS junctions … primarily used PdAu as a normal metal barrier material. In this paper we present results of circuits having MoSi 2 … The main advantages of MoSi 2 are that it can be etched in a low energy plasma, which enables the fabrication of …

FORENSIC STUDY OF THE STEEL IN THE WORLD TRADE CENTER

December 30, 2004
Author(s)
Thomas A. Siewert, Joseph D. McColskey, Christopher N. McCowan, Frank W. Gayle, William E. Luecke, Stephen W. Banovic, Timothy J. Foecke, Richard J. Fields
In September of 2002, the National Institute of Standards and Technology began a two-year investigation into the World … FORENSIC STUDY OF THE STEEL IN THE WORLD TRADE CENTER …

Electrostatic Discharge Protection For Embedded-Sensor Systems-On-a-Chip

October 8, 2004
Author(s)
Javier A. Salcedo, Juin J. Liou, Muhammad Afridi, Allen R. Hefner Jr., Ankush Varma
… CMOS devices during the sensor micromachining processes in addition to the protection provided during normal operation and handling. In this paper, reliable and space-optimized on-chip ESD … devices implemented in the standard double-well CMOS technology. By means of TLP measurements is presented how the …

Materials reliability Division FY 2004 Programs and Accomplishments

September 1, 2004
Author(s)
Alan F. Clark
… slightly this past year, as we have found new, critical technology gaps that limit the reliable use of materials. Yet, we have maintained our competence in our core areas. Much of our research is concentrated in the NIST Strategic Focus Areas of Nanotechnology, Health …

On the Measurement of Two-Photon Single-Mode Coupling Efficiency in Parametric Down-Conversion Photon Sources

July 1, 2004
Author(s)
Stefania Castelletto, Ivo P. Degiovanni, Alan L. Migdall, M J. Ware
… downconversion (PDC). Practical realizations of this technology require that the PDC light be collected into a … describing single mode fibers coupling to PDC light fields in a non-collinear configuration, that lead to two different … Measurement of Two-Photon Single-Mode Coupling Efficiency in Parametric Down-Conversion Photon Sources …

Characterization of Combinatorial Polymer Blend Composition Gradients by FTIR Microspectroscopy

March 1, 2004
Author(s)
Naomi Eidelman, Carl G. Simon Jr.
… was developed for characterizing thin polymer films used in combinatorial materials science. Fourier transform … acid) (PLLA) and poly(D,L-lactic acid) (PDLLA) in the form of thin films (6 cm x2 cm) deposited on IR … gradients. The combination of composition gradient film technology and automated nondestructive FTIR …

X-Ray Topography

February 4, 2004
Author(s)
David R. Black, Gabrielle G. Long
… known and, therefore, has historically been underutilized in the United States. The aim of this guide is to raise the …

Effects of Bending in Brass Rockwell B Scale Test Blocks

June 2, 2003
Author(s)
Samuel R. Low III, J L. Fink
… hardness scale at the National Institute of Standards and Technology (NIST), studies were conducted to observe the … of indentations, each block exhibited an abrupt change in the apparent hardness of the test block. Examination of this phenomena revealed that the abrupt change in hardness was the result of a combination of the bending of …

Bluetooth Dynamic Scheduling and Interference Mitigation

May 1, 2003
Author(s)
Nada T. Golmie
… Bluetooth is a cable replacement technology for Wireless Personal Area Networks. It is … packet loss, latency, delay variation, and throughput. In addition to QOS support, another challenge for Bluetooth … such as latency and bit rate and the parameters used in the algorithm. We study the algorithm's performance and …

The ebXML Test Framework and the Challenges of B2B Testing

May 1, 2003
Author(s)
J Durand, Michael J. Kass, P Wenzel
… for Conformance and Interoperability are emerging as a key technology for enabling and maintaining interoperability … to a common standard (conformance) is just the first step. In addition, it is critical that the selected options, … across partners. Also, as a stack of several standards, as in ebXML, are usually involved, interoperability increasingly …
Displaying 10676 - 10700 of 13225
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