An Evaluation of Two Methods of Comparing Josephson Voltage Standards of Two Laboratories

Published

February 1, 2005

Author(s)

Yi-hua D. Tang, Stuward L. Kupferman, Melquiades T. Salazar

Abstract

The 10 V Josephson voltage standard (JVS) systems of the National Institute of Standards and Technology (NIST) and the Sandia National Laboratories (SNL) were compared by two different methods used simultaneously. The first method uses the well-established technique of the NIST's Measurement Assurance Program (MAP) in which Zener-diode electronic voltage standards (often called as Zener voltage standards) are used as traveling standards. The second method,reported here for the first time, used a recently developed portable JVS as the traveling standards. It provides a thorough verification of a JVS system including all the components of hardware and software as they are used normally to calibrate a secondary voltage standard. The uncertainty of the second method was more than an order of magnitude smaller and provided a way to evaluate the uncertainty associated with the predictability of Zeners when used as traveling standards.

Citation

IEEE Transactions on Instrumentation and Measurement

Pub Type

Journals

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Keywords

Josephson voltage standard, Measurement Assurance Program, transfer standard, traveling standard, uncertainty, Zener voltage standard

Citation

Tang, Y. , Kupferman, S. and Salazar, M. (2005), An Evaluation of Two Methods of Comparing Josephson Voltage Standards of Two Laboratories, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31373 (Accessed October 21, 2025)