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NIST Authors in Bold

Displaying 6826 - 6850 of 13218

NIST Reference Colorimeter

May 9, 2005
Author(s)
Maria E. Nadal, Robert R. Bousquet, Gael Obein
… The Optical Technology Division at the National Institute of Standards and Technology (NIST) developed a reference instrument for … geometries of 0 /45 , ~0 /d, and 8 /d with high accuracy. In addition, this instrument is capable of measuring the full …

An Introduction to the NIST Smart Grid Interoperability Framework

June 1, 2021
Author(s)
Avi Gopstein
… To address changes taking place in the grid, the National Institute of Standards and Technology (NIST) published an update to its Framework and … and network-enabled devices, and an associated surge in the amount and granularity of available data. The …

Metrology of Molecular Devices made by Flip Chip Lamination

April 30, 2010
Author(s)
Christina A. Hacker, Mariona Coll Bau, Curt A. Richter
… to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands … performing electrical functions. One potential alternate technology is molecular electronics. We have focused efforts … remains challenging. This paper gives an overview of our technology highlighting formation of monolayers and …

Multiplexed Readout of CMB Polarimeters

January 5, 2009
Author(s)
Kent D. Irwin
… This paper describes contributions to the workshop, 'Technology Development for a CMB Probe of Inflation,' held at NIST in Boulder CO, Aug. 25-28, 2008 concerning technologies to … benefits and challenges of each option, and analyze their technology readiness level and needed additional investments. …

Determination of Domain Wall Velocity and Nucleation Time by Switching Dynamics Studies of Ferroelectric Hafnium Zirconium Oxide

July 22, 2022
Author(s)
Xiao Lyu, Pragya Shrestha, Mengwei Si, Panni Wang, Junkang Li, Kin (Charles) Cheung, Yu Shimeng, Peide Ye
… In this work, we present the first experimental determination … study the switching dynamics. The switch speed is degraded in high aspect ratio devices due to the longer DW propagation … 2022 IEEE VLSI SYMPOSIUM ON TECHNOLOGY AND CIRCUITS …

Multi-bit per-cell 1T SiGe Floating Body RAM for Cache Memory in Cryogenic Computing

July 22, 2022
Author(s)
Pragya Shrestha, Jason Campbell, Wriddhi Chakraborty, A Gupta, R Saligram, S Spetalnick, A Raychowdhury, Suman Datta
… demonstrate, high-speed multi-bit memory operation in 1T SiGe Floating-body RAM (FBRAM) using 22nm FDSOI … FBRAM shows 8.3x higher memory density with 2.3x/1.8x gain in read/write energy, 3.3x/1.7x in read/write latency and 4.6x in energy-delay product (EDP) … 2022 IEEE Symposium on VLSI Technology and Circuits …

The Case for Technical-Performance Standards for Radiation Inspection Systems

January 1, 2018
Author(s)
Lawrence T. Hudson
… while increasing safety to the public. This is illustrated in this white paper through the lens of the standards … and radiation safety of security-screening systems in the United States that use active radiation probes to … across the life cycle of radiation inspection systems in ways that complement and inform threat-based and …

Image Quality Testing: Selection of Images for Assessing Test Subject Input

September 2, 2014
Author(s)
John R. Jendzurski, Nicholas G. Paulter Jr.
… methods must be developed to ensure that the imagery used in security and safety applications are of sufficient quality … humanperception based step is required that results in perception coefficients that are combined with … method to examine the performance of test subjects in the human-perception based step, which was identification …

Calibration of IR Test Chambers with the Missile Defense Transfer Radiometer

September 30, 2013
Author(s)
Simon G. Kaplan, Solomon I. Woods, Adriaan C. Carter, Timothy M. Jung
… over the fW/cm2 to W/cm2 power range from 3 m to 28 m in wavelength. The MDXR operates in three different modes: as a filter radiometer, a … chambers with a legacy transfer radiometer, the NIST BXR. In general, the results are found to agree within their … Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII …

APPLICATIONS OF HIGH-THROUGHPUT SCREENING TOOLS FOR THERMOELECTRIC MATERIALS

June 21, 2011
Author(s)
Winnie K. Wong-Ng, Howard L. Joress, Joshua B. Martin, Yonggao Y. Yan, Jihui Yang, Makoto Otani, Evan L. Thomas, Martin L. Green, Jason Hattrick-Simpers
… research and development on thermoelectric materials in recent years has been driven primarily by the need for improved efficiency in the global utilization of energy resources. To facilitate … Materials Science and Technology Conference (MS&T 2010) …

Polymer Photochemistry at the EUV Wavelength

June 8, 2010
Author(s)
Charles S. Tarrio, Theodore Fedynyshyn, Russell Goodman, Alberto Cabral, Thomas B. Lucatorto
… Advances in Resist Materials and Processing Technology XXVII …

A 350-GHz high-resolution high-sensitivity passive video imaging system

April 27, 2010
Author(s)
Daniel T. Becker, James A. Beall, Hsiao-Mei Cho, William Duncan, Kent D. Irwin, Gene C. Hilton, Robert D. Horansky, Peter J. Lowell, Michael D. Niemack, Nicholas G. Paulter Jr., Carl D. Reintsema, Francis J. Schima, Robert E. Schwall, Ki W. Yoon, Peter Ade, Carole Tucker, Simon Dicker, Mark Halpern
… Passive Millimeter-Wave Imaging Technology XIII …

Results of an international photomask linewidth comparison of NIST and PTB

October 9, 2009
Author(s)
Bernd Bodermann, Detleff Bergmann, Egbert Buhr, Wolfgang Haebler-Grohne, Harald Bosse, James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Ndubuisi George Orji
… In preparation of the international Nano1 linewidth … NIST and PTB have started a bilateral linewidth comparison in 2008, independent of and prior to the Nano1 comparison in order to test the suitability of the mask standards and … SPIE/BACUS Photomask Technology Conference 2009 …

Noise in ZnO Nanowire Field Effect Transistors

February 5, 2009
Author(s)
Hao Xiong, Wenyong Wang, John S. Suehle, Curt A. Richter, W. Hong, T. Lee
… International Conference on Nanoscience & Technology, China 2007 … Noise in ZnO Nanowire Field Effect Transistors …

Scanning Acoustic Microscopy Stress Measurements in Electronic Packaging

October 16, 2008
Author(s)
E Drescher-Krasicka, T M. Moore, T Hartfield, D Chery
… the nondestructive detection of cracks and delaminations in integrated circuit packages. In reliability tests of molded surface mount components, acoustic microscopy was instrumental in identifying delamination at the mold compound/die … Conference on Characterization and Metrology for ULSI Technology …

A Framework for Measuring the Vulnerability of Hosts

June 30, 2008
Author(s)
Karen A. Scarfone, Timothy Grance
… risk assessment and for attack and vulnerability modeling. In this paper, we propose the framework and its components … 1st International Conference on Information Technology …

Impact of Signaling Load on the UMTS Call Blocking/Dropping

May 11, 2008
Author(s)
Yi Qian, David Tipper, Saowaphak Sasanus
… Radio resources in the third generation (3G) wireless cellular networks … mobile telecommunications system (UMTS) network is limited in term of soft capacity. The quality of a signaling service … data communications where the opposite order is also true. In this paper, we provide the first step to evaluate the …

An Application of Combining Results from Multiple Methods|Statistical Evaluation of Uncertainty for NIST SRM 1508a

October 1, 2005
Author(s)
Adriana Hornikova, Nien F. Zhang, Michael J. Welch, Susan S. Tai
… is based on combining of the measurement results in subsets at each level varying due to use of different … of five method/year combinations as individual subset. In this study, we considered several different statistical … Advances in Science and Technology -Their Impact on Metrology Proceedings …
Displaying 6826 - 6850 of 13218
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