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Displaying 5551 - 5575 of 13218

Water Adsorption in Interfacial Silane Layers by Neutron Reflection: 2. Epoxy plus Silane on Silicon Wafers

October 16, 2008
Author(s)
M S. Kent, W F. McNamara, P M. Baca, W Wright, L A. Domeier, A P. Wong, Wen-Li Wu
… over the silane finish and cured. Profiles of D 2 O in the interphase are measured by neutron reflection after … into the interphase region is observed. The D 2 O profile in the interphase can be described by a two layer model … 2 O is detected (detection limit equivalent to 3 percent) in the interface region under the same conditions if the …

Relative Intensity Noise Suppression for Photonic Links

September 15, 2008
Author(s)
Craig Nelson, Archita Hati, David A. Howe
… is usually implemented by inserting an intensity modulator in the optical path and controlling measured light intensity … propose utilizing the intensity modulator already present in a photonic link to perform the task of RIN suppression as … of 10 MHz. Furthermore, we implement this technique in an optoelectronic oscillator (OEO), significantly …

Amorphous Calcium Phosphate Based Composites: Effect of Surfactants and Poly(Ethylene Oxide) on Filler and Composite Properties

August 19, 2008
Author(s)
Joseph M. Antonucci, Da-Wei Liu, Drago Skrtic
… have adverse effects on the properties of ACP composites. In this paper we assessed the influence of non-ionic and … size distribution and compositional properties of ACP. In addition, the mechanical strength of polymeric composites … about 45 % (4.1 m vs. 7.4 m for the Zr-ACP control).In the presence of PEO, however, the dm increased to 14.1 m. …

Synchronization monitoring of I/Q data and pulse carving misalignment for a serial-type 80-Gb/s RZ-DQPSK transmitter through optical/RF clock tone measurement

August 4, 2008
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Scott Nuccio, Omer F. Yilmaz, Loukas Paraschis, Yannick K. Lize, Alan Willner
… technique for determining misalignment between the in-phase/ quadrature (I/Q) data streams and between the data and pulse carving in an 80 Gb/s serial-type return-to-zero differential … IEEE Photonics Technology Letters …

Structural and Electronic Properties of Bilayer Epitaxial Graphene

July 1, 2008
Author(s)
Gregory M. Rutter, Jason Crain, N Guisinger, Phillip N. First, Joseph A. Stroscio
… the Fermi level. An analysis of the scattering observed in the conductance maps allows the measurement of the … dispersion relation within 100 meV of the Fermi level. In contrast to lattice defects, the disorder from the … surface steps below the graphene play a much lesser role in the scattering of charge carriers. …

The Atomic-Scale Investigation of Graphene Formation on 6H-SiC(0001)

July 1, 2008
Author(s)
N Guisinger, Gregory M. Rutter, Jason Crain, Christian Heiliger, P First, Joseph A. Stroscio
… stages of ultra high vacuum (UHV) graphitization resulted in the growth of individual graphene sheets on random SiC … further graphitization to multilayer thickness resulted in multiple defects as observed with the STM. We characterize … Journal of Vacuum Science and Technology A …

Designing high electron mobility transistor heterostructures with quantum dots for efficient, number-resolving photon detection

May 1, 2008
Author(s)
Mary A. Rowe, Eric Gansen, M. Greene, Danna Rosenberg, Todd E. Harvey, Mark Su, Robert Hadfield, Sae Woo Nam, Richard P. Mirin
… quantum dots as an optically addressable gate in a field-effect transistor. Our design features a dedicated … charge traps allows us to contain the photoexcited holes in a well-defined plane. We derive an equation for a uniform … Journal of Vacuum Science and Technology B …

Photoresist Cross-sectioning with Negligible Damage using a Dual-beam FIB-SEM: A High Throughput Method for Profile Imaging

November 1, 2007
Author(s)
James Clarke, Martin Schmidt, Ndubuisi George Orji
… Imaging of photoresist cross sections in a focused ion beam (FIB)-scanning electron microscope … (SEM) is demonstrated with negligible damage. An in situ chromium sputtering technique is used to deposit … chromium target suspended over the wafer surface resulting in a less damaging metal deposition step. The subsequent …

Parallel-Plate Rheometer Calibration Using Oil and Lattice Boltzmann Simulation

October 11, 2007
Author(s)
Chiara F. Ferraris, Nicos Martys, M R. Geiker, N V. Muzzatti
… The flow in traditional rotational rheometers is well known and … lattice Boltzman methodology was used to simulate the flow in the modified rheometer. These simulations reproduced the … geometry, thus validating the experimental approach. In addition, these simulations show that small changes in the …

Wavelength bistability in two-section mode-locked quantum-dot diode lasers

June 1, 2007
Author(s)
Mingming M. Feng, N. A. Brilliant, Steven T. Cundiff, Richard Mirin, Kevin L. Silverman
… power and pulse width (6.5 ps) are almost identical in the two lasing modes under optimized conditions. The … IEEE Photonics Technology Letters … Wavelength bistability in two-section mode-locked quantum-dot diode lasers …

Influence of Base Additives on the Reaction Diffusion Front of Model Chemically Amplified Photoresists

January 11, 2007
Author(s)
B D. Vogt, Shuhui Kang, Vivek Prabhu, Ashwin Rao, Eric K. Lin, Sushil K. Satija, Karen Turnquest, Wen-Li Wu
… photoacid catalyzed deprotection reaction-diffusion front in model photoresists was measured by combination of neutron … and Fourier transform infrared spectroscopy. Modulation in the location of the base in reference to the diffusing photoacid catalyst illuminates …

Using Laser-Cooled Atoms as a Focused Ion Beam Source

December 1, 2006
Author(s)
James L. Hanssen, E Dakin, Jabez J. McClelland, M Jacka
… quality focused ion beam using laser-cooled neutral atoms in a magneto-optical trap as an ion source. They show that … values that are better than the state of the art in focused ion beams. The source can be used with a range of … Journal of Vacuum Science and Technology B …

Evidence for Internal Stresses Induced by Nanoimprint Lithography

November 30, 2006
Author(s)
Hyun Wook Ro, Yifu Ding, Hae-Jeong Lee, Daniel R. Hines, Ronald L. Jones, Eric K. Lin, Alamgir Karim, Wen-Li Wu, Christopher L. Soles
… mold leads to internal stresses.At elevated temperatures in the freestanding structures (once the mold has been … from the imprint), there is an accelerated reduction in pattern height in the reverse direction from which the material originally … Journal of Vacuum Science and Technology B …

Exposure Dose Effects on the Reaction-Diffusion Process in Model extreme ultraviolet Photoresists

November 30, 2006
Author(s)
Kristopher Lavery, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Kwang-Woo Choi
… of exposure dose on the latent image deprotection profile in a model extreme ultraviolet (EUV) photoresist polymer, … into unexposed regions of a photoresist is limited even in the absence of base quencher additives. These fundamental … Journal of Vacuum Science and Technology B …

Characterizing Fiber Bragg Grating Index Profiles to Improve the Writing Process

November 1, 2006
Author(s)
Robert J. Espejo, Mikael Svalgaard, Shellee D. Dyer
… method for identifying both systematic and random errors in a fiber Bragg grating (FBG) writing system and show its … system. We demonstrate the ability to identify errors in the writing process that would not likely be found from a … IEEE Photonics Technology Letters …
Displaying 5551 - 5575 of 13218
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