Sayan, S.
, Chandler-Horowitz, D.
, Nguyen, N.
and Ehrstein, J.
(2008),
High Sensitivity Attenuated Total Reflection Fourier Transform Infrared Spectroscopy Study of Ultrathin ZrO2 Films: A Study of Phase Change, Journal of Vacuum Science and Technology A, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32977
(Accessed January 19, 2025)
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High Sensitivity Attenuated Total Reflection Fourier Transform Infrared Spectroscopy Study of Ultrathin ZrO2 Films: A Study of Phase Change
Published
Author(s)
Safak Sayan, , ,
Citation
Journal of Vacuum Science and Technology A
Volume
26
Issue
2
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 2, 2008, Updated October 12, 2021