NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21601 - 21625 of 73697

Table-top ultrafast x-ray microcalorimeter spectrometry for molecular structure

March 26, 2013
Author(s)
Jens (. Uhlig, William B. Doriese, Joseph W. Fowler, Daniel S. Swetz, Carl D. Reintsema, Douglas A. Bennett, Leila R. Vale, Gene C. Hilton, Kent D. Irwin, Joel N. Ullom, Ilari Maasilta, Wilfred Fullagar, Niklas Gador, Sophie Canton, Kimmo Kinnunen, Villy Sundstrom
This work presents an x-ray absorption measurement by use of ionizing radiation generated by a femtosecond pulsed laser source. The spectrometer was a microcalorimetric array whose pixels are capable of accurately measuring energies of individual radiation

3-D Optical Metrology of Finite sub-20 nm Dense Arrays using Fourier Domain Normalization

March 25, 2013
Author(s)
Jing Qin, Hui Zhou, Bryan M. Barnes, Ronald G. Dixson, Richard M. Silver
Reduced target dimensions requiring improved resolution and sensitivity have driven the need to use and analyze the phase and scattered frequency information available when using image-based scatterometry systems. One such system is scatterfield microscopy

Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes

March 25, 2013
Author(s)
Joseph J. Kopanski, Muhammad Y. Afridi, Chong Jiang, Michael Lorek, Timothy Kohler, Curt A. Richter
The charge based capacitance measurement (CBCM) technique is highly sensitive to small capacitances and capable integration of onto an AFM tip, thereby reducing stray and wire capacitance to the bare minimum. The CBCM technique has previous been applied to

Spatially-Resolved Dopant Characterization with a Scanning Microwave Microscope

March 25, 2013
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, Alexandra E. Curtin, Pavel Kabos, Matthew D. Brubaker, Norman A. Sanford, Kristine A. Bertness
The scanning microwave microscope (SMM) is a tool for spatially-resolved microwave characterization of nanoelectronic materials and devices. The microscope incorporates a sharp, near-field probe, which measures local changes in reflected microwave signals

ACTS: A Combinatorial Test Generation Tool

March 22, 2013
Author(s)
Raghu N. Kacker
In this paper, we introduce a combinatorial test generation tool called Advanced Combinatorial Testing System (or ACTS). ACTS supports t-way combinatorial test generation with several advanced features such as mixed-strength test generation and constraint

An Input Space Modeling Methodology for Combinatorial Testing

March 22, 2013
Author(s)
Mehra N. Borazjany, Laleh Ghandehari, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
The input space of a system must be modeled before combinatorial testing can be applied to this system. The effectiveness of combinatorial testing to a large extent depends on the quality of the input space model. In this paper we introduce an input space

Applying Combinatorial Testing to the Siemens Suite

March 22, 2013
Author(s)
Laleh Ghandehari, Mehra N. Borazjany, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
Combinatorial testing has attracted a lot of attention from both industry and academia. A number of reports suggest that combinatorial testing can be effective for practical applications. However, there still seems to lack systematic, controlled studies on

Combinatorial Coverage Measurement Concepts and Applications

March 22, 2013
Author(s)
David R. Kuhn, Itzel (. Dominquez Mendoza, Raghu N. Kacker, Yu Lei
Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures

Concept Analysis to Enrich Manufacturing Service Capability Models

March 22, 2013
Author(s)
Jun H. Shin, Boonserm Kulvatunyou, Yunsu Lee, Nenad Ivezic
When an Original Equipment Manufacturer (OEM), which makes a final product for the consumer marketplace by purchasing components from its suppliers, faces unexpected supply network failures and market events, models of suppliers’ manufacturing service

Requirements Analysis for Safer Ambulance Patient Compartments

March 22, 2013
Author(s)
Mehdi Dadfarnia, Yung-Tsun T. Lee, Allison Barnard Feeney, Deogratias Kibira
Providing emergency care services in the confined space of the patient compartment of a moving ambulance is a hazardous activity. A National Institute of Standards & Technology (NIST)/Department of Homeland Security (DHS) project is applying systems

Standard Reference Materials for Food Analysis

March 21, 2013
Author(s)
Melissa M. Phillips, Katherine E. Sharpless, Stephen A. Wise
Well-characterized reference materials with assigned concentrations of nutrients are needed as matrix-matched controls for analytical measurements to assist food manufacturers in quality control and facilitate compliance with nutritional labeling laws. The

Towards the Integration of Carbon Nanotubes as Vias in Monolithic 3D Integrated Circuits

March 21, 2013
Author(s)
Ann C. Chiaramonti Debay, Sten Vollebregt, Johan van der Cingel , Kees Beenakker, R. Ishihara
Carbon nanotubes (CNT) can be an attractive candidate for vertical interconnects (vias) in 3D integrated circuits due to their excellent thermal and electrical properties. To investigate CNT electrical resistivity, test vias were fabricated using both a

Arbitrary waveform generator for quantum information processing with trapped ions

March 20, 2013
Author(s)
Ryan S. Bowler, Ulrich J. Warring, Joseph W. Britton, J. M. Amini
Ions confined in a multi-electrode trap design have been proposed as a possible basis for quantum information processing. This scheme involves transporting ions between spatially distinct locations using time varying electric potentials combined with laser
Displaying 21601 - 21625 of 73697
Was this page helpful?