Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Frontiers of Characterization and Metrology for Nanoelectronics: 2013

Published

Author(s)

Erik M. Secula, David G. Seiler
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2013
Conference Dates
March 26-28, 2013
Conference Location
Gaithersburg, MD
Conference Title
2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Citation

Secula, E. and Seiler, D. (2013), Frontiers of Characterization and Metrology for Nanoelectronics: 2013, Frontiers of Characterization and Metrology for Nanoelectronics: 2013, Gaithersburg, MD (Accessed July 6, 2022)
Created March 26, 2013, Updated February 19, 2017