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Nanotechnology

Nanometrology

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Displaying 401 - 425 of 855

Scanning Ion Microscopy with Low Energy Lithium Ions

July 1, 2014
Author(s)
Kevin A. Twedt, Lei Chen, Jabez J. McClelland
Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers and beam energies from 500 eV to 5 keV. These beam energies are much lower than the typical

Quasiparticle scattering from topological crystalline insulator SnTe (001) surface states

June 27, 2014
Author(s)
Duming Zhang, Hongwoo H. Baek, Jeonghoon Ha, Tong Zhang, Jonathan E. Wyrick, Albert Davydov, Young Kuk, Joseph A. Stroscio
Recently, the topological classification of electronic states has been extended to a new class of matter known as topological crystalline insulators. Similar to topological insulators, topological crystalline insulators also have spin-momentum locked

Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material

June 11, 2014
Author(s)
Karen E. Murphy, Jingyu Liu, William F. Guthrie, Justin M. Gorham, John E. Bonevich, Andrew J. Allen, Michael R. Winchester, Vincent A. Hackley, Robert MacCuspie
In this study we use inductively coupled plasma mass spectrometry operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new silver nanoparticle (AgNP) candidate reference

Intermittent contact resonance atomic force microscopy

May 23, 2014
Author(s)
Gheorghe Stan, Richard S. Gates
The intermittent contact resonance atomic force microscopy (ICR-AFM) mode proposed here is a new frequency modulation technique performed in scanning force controlled AFM modes like force volume or peak force tapping. It consists of tracking the change in

Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity

May 15, 2014
Author(s)
Jan Obrzut, Nathan D. Orloff, Oleg A. Kirillov
A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials

Comparison of thin epitaxial film silicon photovoltaics fabricated on monocrystalline and polycrystalline seed layers on glass

May 5, 2014
Author(s)
C W. Teplin, Sachit Grover, Adrian Chitu, Alexander Limanov, Monical Chalal, James Im, Daniel Amkreutz, Stefan Gall, Heayoung Yoon, Vincenzo Lasalvia, H M. Branz, Paul Stradins, Kim M. Jones, Andrew G. Norman, David L. Young, Benjamin Lee
We fabricate thin epitaxial c-Si solar cells on display glass and fused silica substrates overcoated with a Si seed layer. We achieve an open circuit voltage (VOC) of 586 mV and 6.5% efficiency using a 2 µm thick absorber on a (100) monocrystalline layer

Measurement of Nanomaterials in Foods: Integrative Consideration of Challenges and Future Prospects

April 30, 2014
Author(s)
Christopher W. Szakal, Steve Roberts, Paul Westerhoff, Andrew Bartholomaeus, Neil Buck, Ian Illuminato, Richard Canady, Michael Rogers
Risks and benefits of nanomaterials related to food receive conflicting attention in news media, research, and across expert stakeholder groups internationally. Current nanomaterial analysis is complicated by broad definitions that include traditional food

2013 ITRS Metrology Roadmap

April 15, 2014
Author(s)
Alain C. Diebold, Ndubuisi George Orji
In 2013 the ITRS Metrology Technical Working Group worked on updating the text and tables of the metrology chapter. New additions include a section on 3D nanometrology, a revised lithography metrology table, and an updated Interconnect section. The

Optimizing Hybrid Metrology through a Consistent Multi-Tool Parameter Set and Uncertainty Model

April 14, 2014
Author(s)
Richard M. Silver, Bryan Barnes, Nien F. Zhang, Hui Zhou, Andras Vladar, John S. Villarrubia, Regis J. Kline, Daniel Sunday, Alok Vaid
There has been significant interest in hybrid metrology as a novel method for reducing overall measurement uncertainty and optimizing measurement throughput (speed) through rigorous combinations of two or more different measurement techniques into a single

Optical volumetric inspection of sub-20 nm patterned defects with wafer noise

April 2, 2014
Author(s)
Bryan M. Barnes, Francois R. Goasmat, Martin Y. Sohn, Hui Zhou, Richard M. Silver, Andras Vladar, Abraham Arceo
We have previously introduced a new data analysis method that more thoroughly utilizes scattered optical intensity data collected during defect inspection using bright-field microscopy. This volumetric approach allows conversion of focus resolved 2-D

Establishing an upper bound on contact resistivity of ohmic contacts to n-GaN nanowires

April 1, 2014
Author(s)
Paul T. Blanchard, Kristine A. Bertness, Todd E. Harvey, Norman A. Sanford
Contact resistivity ρ c is an important figure of merit in evaluating and improving the performance of electronic and optoelectronic devices. Due to the small size, unique morphology, and uncertain transport properties of semiconductor nanowires (NWs)

Twin Plane Re-entrant Mechanism for Catalytic Nanowire Growth

March 12, 2014
Author(s)
Andrew D. Gamalski, Peter W. Voorhees, Renu Sharma, Caterina Ducati, Stephan Hofmann
We observe a twin plane re-entrant based growth mechanism for Au catalyzed Ge nanowire growth using video-rate lattice-resolved environmental transmission electron microscopy. For a [112] growth direction, we find a convex, V-shaped liquid catalyst

Visualizing Nanoparticle Dissolution by Imaging Mass Spectrometry

March 10, 2014
Author(s)
Christopher W. Szakal, Melissa S. Ugelow, Justin M. Gorham, Andrew R. Konicek, Richard D. Holbrook
We demonstrate the ability to visualize nanoparticle dissolution while simultaneously providing chemical signatures that differentiate between citrate-capped silver nanoparticles (AgNPs), AgNPs forced into dissolution via exposure to UV radiation, silver

Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters

March 5, 2014
Author(s)
De-Hao D. Tsai, Tae Joon Cho, Frank W. DelRio, Justin Gorham, Jiwen Zheng, Jiaojie Tan, Michael R. Zachariah, Vincent A. Hackley
We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility

Capabilities of Single Particle Inductively Coupled Plasma Mass Spectrometry for the Size Measurement of Nanoparticles: A Case Study on Gold Nanoparticles

February 28, 2014
Author(s)
Jingyu Liu, Karen E. Murphy, Robert I. MacCuspie, Michael R. Winchester
The increasing application of engineered nanomaterials in consumer and medical products has motivated the development of single particle inductively coupled plasma mass spectrometry (spICP-MS) for characterizing nanomaterials under realistic environmental
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