Stan, G.
and Solares, S.
(2014),
Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914965
(Accessed June 10, 2023)
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Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies
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Abstract
We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample excitation). We discussed similarities and differences in the observables, as well as the different effect of the tip-sample contact properties on those observables in each configuration. Finally, we explored the expected accuracy of CR-AFM using phase-locked loops, providing a quantification of the typical errors incurred during measurement.Citation
Beilstein Journal of Nanotechnology
Pub Type
Journals
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Keywords
dynamic AFM, contact-resonance AFM, viscoelasticity, phase-locked loop, frequency modulation
Citation
Created March 12, 2014, Updated February 19, 2017