Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies

Published

Author(s)

Gheorghe Stan, Santiago D. Solares Rivera

Abstract

We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample excitation). We discussed similarities and differences in the observables, as well as the different effect of the tip-sample contact properties on those observables in each configuration. Finally, we explored the expected accuracy of CR-AFM using phase-locked loops, providing a quantification of the typical errors incurred during measurement.
Citation
Beilstein Journal of Nanotechnology

Keywords

dynamic AFM, contact-resonance AFM, viscoelasticity, phase-locked loop, frequency modulation

Citation

Stan, G. and Solares, S. (2014), Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914965 (Accessed April 20, 2024)
Created March 12, 2014, Updated February 19, 2017