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Displaying 426 - 450 of 855

Nanoscale mechanics by tomographic contact resonance atomic force microscopy

January 23, 2014
Author(s)
Gheorghe NMN Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su
We report on a quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) polymer blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth

Saponins: A sustainable surfactant. From its microwave-assisted extraction to the synthesis of monodisperse latices

January 21, 2014
Author(s)
Charlene Schnitt, Bruno Grassl, Julien C. Gigault, Vincent A. Hackley, Gaetane Lespes, Jacques Desbrieres, Virginie Pellerin, Stephanie Reynaud
Synthetic surfactants are widely used in emulsion polymerization, but it is increasingly desirable to replace them with naturally derived molecules with a reduced environmental burden. This study demonstrates the use of saponins as sustainable and

SPRITE: A modernized approach to scanning probe contact resonance imaging

January 20, 2014
Author(s)
Anthony B. Kos, Jason P. Killgore, Donna C. Hurley
We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical properties

Three-Dimensional Hydrogel Constructs for Dosing Cells with Nanoparticles

January 13, 2014
Author(s)
Elisabeth Mansfield, Tammy L. Oreskovic, Nikki S. Rentz, Kavita M. Jeerage
In evaluating nanoparticle risks to human health, there is often a disconnect between results obtained from in vitro toxicology studies and in vivo activity, prompting the need for improved methods to rapidly assess the hazards of engineered nanomaterials

Epitaxial Si encapsulation of highly misfitting SiC quantum dot arrays formed on Si (001)

January 8, 2014
Author(s)
Christopher W. Petz, Dongyue Yang, Alline Myers, Jeremey Levy, Jerrold Floro
This work examines Si overgrowth to encapsulate 3C-SiC quantum dot arrays epitaxially grown on Si substrates. Using transmission electron microscopy we show how the crystalline quality of the Si cap depends on the growth conditions. Overgrowth at 300ºC

Development of a conceptual framework for evaluation of nanomaterials release from nanocomposites: environmental and toxicological implications

January 2, 2014
Author(s)
Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin Gorham, Tinh Nguyen, Alexander Orlov
Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lacking

Comparison of atom probe compositional fidelity across thin film interfaces

January 1, 2014
Author(s)
Andrew Herzing, Justin G. Brons, Karen T. Henry, Ian M. Anderson, Gregory B. Thompson
A series of Fe/Ni and Ti/Nb multilayers with bilayer repeat distances of approximately 4 nm have been sputter-deposited onto n-doped Si [001] substrates. The films were focus ion beam milled into the required needle-shaped geometry for atom probe analysis

Statistical Sampling of Carbon Nanotube Populations by Thermogravimetric Analysis

December 25, 2013
Author(s)
Elisabeth Mansfield, Aparna Kar, Chih-Ming Wang, Ann C. Chiaramonti Debay
Carbon nanotubes are one of the most promising nanomaterials on the market, with applications in electronics devices, sensing, batteries, composites and medical communities. Strict control of the carbon nanotube chemistry and properties is necessary as the

Dynamic contact AFM methods for nanomechanical properties

December 1, 2013
Author(s)
Donna C. Hurley, Jason P. Killgore
This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them from

Accurate Spring Constant Calibration for very Stiff Atomic Force Microscopy Cantilevers

November 26, 2013
Author(s)
Scott Grutzik, Richard S. Gates, Yvonne B. Gerbig, Douglas T. Smith, Robert F. Cook, Alan Zehnder
There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is

Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects

November 13, 2013
Author(s)
Norman A. Sanford, David R. Diercks, Brian Gorman, R Kirchofer, Kristine A. Bertness, Matthew D. Brubaker
The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in

On the Determination of Carbon by PGAA

November 10, 2013
Author(s)
Rolf L. Zeisler, Rick L. Paul, Jeffrey A. Fagan, Zsolt R?vay, Stefan S?llradl
Determination of carbon was achieved with reduction of background in prompt gamma activation analysis.

Three-dimensional deep sub-wavelength defect detection using (lambda) = 193 nm optical microscopy

October 25, 2013
Author(s)
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Andras Vladar, Richard M. Silver, Abraham Arceo
Identifying defects in photolithographic patterning is a persistent challenge in semiconductor manufacturing. Well-established optical methods in current use are jeopardized by upcoming sub-20 nm device dimensions. Volumetric processing of focus-resolved

New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD

October 9, 2013
Author(s)
Roy H. Geiss, Robert R. Keller, Katherine P. Rice
The technique of acquiring transmission electron diffraction patterns in the scanning electron microscope, SEM, using components of commercially available electron backscattered diffraction equipment, EBSD, normally used in a reflection geometry, was first

Local electrical characterizations of cadmium telluride solar cells using low energy electron beam

October 1, 2013
Author(s)
Heayoung Yoon, Paul M. Haney, Dmitry A. Ruzmetov, Hua Xu, Marina S. Leite, Behrang H. Hamadani, Albert A. Talin
We investigate local electronic properties of cadmium telluride solar cells using electron beam induced current (EBIC) measurements with current-collecting patterned contacts. EBIC measurements are performed with a spatial resolution as high as ≈20 nm both

Strong Casimir force reduction by metallic surface nanostructuring

September 27, 2013
Author(s)
Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S. Davids, Ricardo Decca, Vladimir Aksyuk, Diego A. Dalvit, Daniel Lopez
The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of

A Missing Link in the Cascade Formation of High Symmetry Fullerene Cages

September 15, 2013
Author(s)
Dan Bearden, Jianyuan Zhang, Harry C. Dorn
Before the discovery of graphene, many versions of a “bottom-up” fullerene formation mechanism had been advanced starting with carbide (C2) that forms small carbon cluster chains and rings. However, in recent years evidence is emerging suggesting a “top

Generalized Tabletop EUV Coherent Diffractive Imaging in a Transmission Geometry

September 11, 2013
Author(s)
Justin M. Shaw, Bosheng Zhang, Matthew Seaberg, Daniel Adams, Dennis Gardner, Elizabeth Shanblatt, Henry C. Kapteyn, Margaret M. Murnane
We demonstrate the first generalized tabletop EUV coherent microscope that can image extended, non-isolated, non-periodic, objects. By implementing keyhole coherent diffraction imaging with curved mirrors and a tabletop high harmonic source, we demonstrate
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