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Gheorghe NMN Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su
We report on a quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) polymer blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth
Charlene Schnitt, Bruno Grassl, Julien C. Gigault, Vincent A. Hackley, Gaetane Lespes, Jacques Desbrieres, Virginie Pellerin, Stephanie Reynaud
Synthetic surfactants are widely used in emulsion polymerization, but it is increasingly desirable to replace them with naturally derived molecules with a reduced environmental burden. This study demonstrates the use of saponins as sustainable and
Anthony B. Kos, Jason P. Killgore, Donna C. Hurley
We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical properties
Elisabeth Mansfield, Tammy L. Oreskovic, Nikki S. Rentz, Kavita M. Jeerage
In evaluating nanoparticle risks to human health, there is often a disconnect between results obtained from in vitro toxicology studies and in vivo activity, prompting the need for improved methods to rapidly assess the hazards of engineered nanomaterials
Elisabeth Mansfield, Chris M. Poling, Jenifer L. Blacklock, Katherine M. Tyner
The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments (e.g
Christopher W. Petz, Dongyue Yang, Alline Myers, Jeremey Levy, Jerrold Floro
This work examines Si overgrowth to encapsulate 3C-SiC quantum dot arrays epitaxially grown on Si substrates. Using transmission electron microscopy we show how the crystalline quality of the Si cap depends on the growth conditions. Overgrowth at 300ºC
Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin Gorham, Tinh Nguyen, Alexander Orlov
Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lacking
Andrew Herzing, Justin G. Brons, Karen T. Henry, Ian M. Anderson, Gregory B. Thompson
A series of Fe/Ni and Ti/Nb multilayers with bilayer repeat distances of approximately 4 nm have been sputter-deposited onto n-doped Si [001] substrates. The films were focus ion beam milled into the required needle-shaped geometry for atom probe analysis
On 29 December 1959 at the annual meeting of the American Physical Society, Richard Feynman gave a lecture at the California Institute of Technology titled "There Is Plenty of Room at the Bottom: An Invitation to Enter a New Field of Physics." This
Elisabeth Mansfield, Aparna Kar, Chih-Ming Wang, Ann C. Chiaramonti Debay
Carbon nanotubes are one of the most promising nanomaterials on the market, with applications in electronics devices, sensing, batteries, composites and medical communities. Strict control of the carbon nanotube chemistry and properties is necessary as the
A method for locally sensing and storing data of transverse domain wall chirality in planar nanowire logic and memory systems is presented. Patterned elements, in close proximity to the nanowires, respond to the asymmetry in the stray field from the domain
This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them from
Scott Grutzik, Richard S. Gates, Yvonne B. Gerbig, Douglas T. Smith, Robert F. Cook, Alan Zehnder
There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is
Donna C. Hurley, Sara E. Campbell, Jason P. Killgore, Lewis M. Cox, Yifu Ding
We show how atomic force microscopy techniques based on contact resonance (CR) can be used to measure the viscoelastic loss tangent tan δ of polymeric materials. Absolute values of tan δ do not involve intermediate calculation of loss modulus and storage
John H. Lehman, Evangelos Theocharous, Savva Theocharous
A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO 3 has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluated using
Norman A. Sanford, David R. Diercks, Brian Gorman, R Kirchofer, Kristine A. Bertness, Matthew D. Brubaker
The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Andras Vladar, Richard M. Silver, Abraham Arceo
Identifying defects in photolithographic patterning is a persistent challenge in semiconductor manufacturing. Well-established optical methods in current use are jeopardized by upcoming sub-20 nm device dimensions. Volumetric processing of focus-resolved
The technique of acquiring transmission electron diffraction patterns in the scanning electron microscope, SEM, using components of commercially available electron backscattered diffraction equipment, EBSD, normally used in a reflection geometry, was first
Heayoung Yoon, Paul M. Haney, Dmitry A. Ruzmetov, Hua Xu, Marina S. Leite, Behrang H. Hamadani, Albert A. Talin
We investigate local electronic properties of cadmium telluride solar cells using electron beam induced current (EBIC) measurements with current-collecting patterned contacts. EBIC measurements are performed with a spatial resolution as high as ≈20 nm both
Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S. Davids, Ricardo Decca, Vladimir Aksyuk, Diego A. Dalvit, Daniel Lopez
The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of
Bryan M. Barnes, Jing Qin, Hui Zhou, Richard M. Silver
Recently, a new technique called Fourier normalization has enabled the parametric fitting of optical images with multiple or even a continuum of spatial frequencies. Integral to the performance of this methodology is the characterization of the high
Before the discovery of graphene, many versions of a bottom-up fullerene formation mechanism had been advanced starting with carbide (C2) that forms small carbon cluster chains and rings. However, in recent years evidence is emerging suggesting a top
Justin M. Shaw, Bosheng Zhang, Matthew Seaberg, Daniel Adams, Dennis Gardner, Elizabeth Shanblatt, Henry C. Kapteyn, Margaret M. Murnane
We demonstrate the first generalized tabletop EUV coherent microscope that can image extended, non-isolated, non-periodic, objects. By implementing keyhole coherent diffraction imaging with curved mirrors and a tabletop high harmonic source, we demonstrate