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Nanoscale mechanics by tomographic contact resonance atomic force microscopy

Published

Author(s)

Gheorghe NMN Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su

Abstract

We report on a quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) polymer blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.
Citation
Nature Nanotechnology

Keywords

nanoscale mechanics, atomic force microscopy, contact resonance, elastic modulus, dissipation

Citation

, G. , Solares, S. , Pittenger, B. , Erina, N. and Su, C. (2014), Nanoscale mechanics by tomographic contact resonance atomic force microscopy, Nature Nanotechnology, [online], https://doi.org/10.1039/c3nr04981g (Accessed April 23, 2024)
Created January 23, 2014, Updated November 10, 2018