Nanoscale mechanics by tomographic contact resonance atomic force microscopy
Gheorghe NMN Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su
We report on a quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) polymer blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.
, Solares, S.
, Pittenger, B.
, Erina, N.
and Su, C.
Nanoscale mechanics by tomographic contact resonance atomic force microscopy, Nature Nanotechnology, [online], https://doi.org/10.1039/c3nr04981g
(Accessed June 6, 2023)