U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Nanoscale mechanics by tomographic contact resonance atomic force microscopy

Published

Author(s)

Gheorghe NMN Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su

Abstract

We report on a quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) polymer blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences of the measured parameters were analyzed to generate cross-sectional images of tomographic reconstructions. Through a suitable normalization of the measured contact stiffness and indentation depth, the depth-dependence of the contact stiffness was analyzed by linear fits to obtain the elastic moduli of the materials probed. Besides elastic moduli, the contributions of adhesive forces (short-range versus long-range) to contact on each material were determined without a priori assumptions. The adhesion analysis was complemented by an unambiguous identification of distinct viscous responses during adhesion and in-contact deformation from the dissipated power during indentation.
Citation
Nature Nanotechnology
Pub Type
Journals

Download Paper

https://doi.org/10.1039/c3nr04981g

Keywords

nanoscale mechanics, atomic force microscopy, contact resonance, elastic modulus, dissipation
Polymers, Nanomaterials and Nanometrology

Citation

, G. , Solares, S. , Pittenger, B. , Erina, N. and Su, C. (2014), Nanoscale mechanics by tomographic contact resonance atomic force microscopy, Nature Nanotechnology, [online], https://doi.org/10.1039/c3nr04981g (Accessed October 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 23, 2014, Updated November 10, 2018