NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Published
Author(s)
Jan Obrzut, Nathan D. Orloff, Oleg A. Kirillov
Abstract
A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials development and production. Non-contact measurement is performed in WR-90 waveguide configuration in the X-band frequency band from 6 GHz to 12 GHz. The presented semi-empirical perturbation model correlates the experimental quality factor and the specimen volume with the specimen imaginary part of permittivity and conductance. The measurement is illustrated on conducting carbon nanotube films having volumes in the range of 10-5 cm3 and conductivity of 50 S/cm.
Proceedings Title
Proceedings of the 2014 IEEE International Instrumentation and Measurement Technology
Obrzut, J.
, Orloff, N.
and Kirillov, O.
(2014),
Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity, Proceedings of the 2014 IEEE International Instrumentation and Measurement Technology , Montevideo, -1, [online], https://doi.org/10.1109/I2MTC.2014.6860856
(Accessed October 10, 2025)