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This report examines the effects of uncertainties in temperature and coefficient of thermal expansion on the expanded uncertainty of length dimensional measurements made away from the international standard reference temperature of 20degrees C for artifact
The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing four
H. W. Tseng, John A. Dagata, Richard M. Silver, Joseph Fu, J R. Lowney
Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetrically
Jabez J. McClelland, John Unguris, R E. Scholten, Daniel T. Pierce
A simple, compact Cr evaporator is constructed by electroplating Cr metal onto the tip of a W hairpin filament. At 5 cm from the evaporator, deposition rates up to 10 nm min -1 (flux {asymp} 10 19 atoms m -2s -1) have been obtained, with total deposition
Record truncation discontinuities (RTD's) are artifacts in recorded data caused by the difference between the values of the data at the two ends of the record. The RTD causes errors in waveform reconstructions, in particular, in digital reconstructions
In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establish
R N. Watts, Charles S. Tarrio, Thomas B. Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William T. Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore V. Vorburger