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TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces

Published

Author(s)

J. Bennett, John A. Dagata

Abstract

Not available.
Citation
Chapter in: Secondary Ion Mass Spectrometry SIMS IX, A. Benninghoven, et al., Editors
Publisher Info
John Wiley and Sons Ltd, Chichester, UK,

Citation

Bennett, J. and Dagata, J. (1994), TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces, John Wiley and Sons Ltd, Chichester, UK, (Accessed February 24, 2024)
Created December 31, 1993, Updated October 12, 2021