Bennett, J.
and Dagata, J.
(1994),
TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces, John Wiley and Sons Ltd, Chichester, UK,
(Accessed May 24, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces
Published
Author(s)
J. Bennett,
Abstract
Not available.Citation
Chapter in: Secondary Ion Mass Spectrometry SIMS IX, A. Benninghoven, et al., Editors
Publisher Info
John Wiley and Sons Ltd, Chichester, UK,
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1993, Updated October 12, 2021