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Traceable Standards for Scanning Electron Microscopy
Published
Author(s)
Michael T. Postek
Abstract
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.
Proceedings Title
Proceedings of Microscopy Society of America, John Friel, Editor
Postek, M.
(1994),
Traceable Standards for Scanning Electron Microscopy, Proceedings of Microscopy Society of America, John Friel, Editor, Unknown, USA
(Accessed June 6, 2023)