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PUBLICATIONS

Traceable Standards for Scanning Electron Microscopy

Published

Author(s)

Michael T. Postek

Abstract

The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.
Proceedings Title
Proceedings of Microscopy Society of America, John Friel, Editor
Conference Dates
January 1, 1994
Conference Location
Unknown, USA
Conference Title
Microscopy Society of America
Pub Type
Conferences
Manufacturing and Metrology

Citation

Postek, M. (1994), Traceable Standards for Scanning Electron Microscopy, Proceedings of Microscopy Society of America, John Friel, Editor, Unknown, USA (Accessed October 27, 2025)

Issues

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Created January 1, 1994, Updated February 19, 2017
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