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Traceable Standards for Scanning Electron Microscopy

Published

Author(s)

Michael T. Postek

Abstract

The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.
Proceedings Title
Proceedings of Microscopy Society of America, John Friel, Editor
Conference Dates
January 1, 1994
Conference Location
Unknown, USA
Conference Title
Microscopy Society of America

Citation

Postek, M. (1994), Traceable Standards for Scanning Electron Microscopy, Proceedings of Microscopy Society of America, John Friel, Editor, Unknown, USA (Accessed July 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1994, Updated February 19, 2017