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Electronics

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  • Published Date
Displaying 326 - 350 of 690

Peridynamic Simulation of Electromigration

January 1, 2008
Author(s)
David T. Read, Walter Gerstle, Stewart Silling, Vinod K. Tewary, Richard Lehoucq
A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat

Sources of Uncertainty for Near-Field Measurements

November 11, 2007
Author(s)
Michael H. Francis, Ronald C. Wittmann
We discuss the sources of uncertainty in near-field measurements and their impact on far-field antenna parameters. The methods of estimating these uncertainties can be considered in three broad categories: theoretical estimation (analytical), computer

Free Space Antenna Factors through the Use of Time-Domain Signal Processing

September 1, 2007
Author(s)
Dennis G. Camell, Robert Johnk, David R. Novotny, Chriss A. Grosvenor
This paper demonstrates the usefulness of time-domain processing to determine free-space antenna factors (FSAF) for electromagnetic compatibility (EMC) antennas. Our procedures are explained and data are provided for frequencies from 30 MHz to 9GHz. We

Key nonlinear measurement events

August 1, 2007
Author(s)
Catherine A. Remley, Dominique Schreurs
In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users' Forum - designed to let participants learn about and discuss

Free Space Antenna Factors through the use of Time-Domain Signal Processing

July 8, 2007
Author(s)
Dennis G. Camell, Robert T. Johnk, David R. Novotny, Chriss A. Grosvenor
This paper demonstrates the usefulness of time domain processing to determine free-space antenna factors,FSAF, for EMC antennas. Procedures are explained and data is provided from 30 MHz to 9 GHz. We investigate time gating of dense frequency packed

RFID Devices and Systems in Homeland Security Applications

July 1, 2007
Author(s)
Kate Remley, Jeffrey R. Guerrieri, Dylan Williams, David R. Novotny, Anthony B. Kos, Nelson Bryner, Nader Moayeri, Michael Souryal, Kang Lee, Steven Fick
This article reports on activities being carried out by the National Institute of Standards and Technology to ensure secure, reliable use of Radio-Frequency Identification (RFID) technology in homeland security and public safety applications. These

Dielectric polarization evolution equations and relaxation times

May 25, 2007
Author(s)
James R. Baker-Jarvis, Billy F. Riddle, Michael D. Janezic
In this paper we develop a model that can describe broadband dielectric response, and includes frequency-dependent loss and the effects of the local electric field. The model is based on a correlation-function approach that we previously developed using

On-Wafer Measurement of Transistor Noise Parameters at NIST

April 1, 2007
Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.

Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices

February 25, 2007
Author(s)
Tam H. Duong, David Berning, Allen R. Hefner Jr., Keyue M. Smedley
This paper presents test system developed for long-term stability characterization of 10 kV Silicon Carbide (SiC) power MOSFETs and SiC diodes under 20 kHz hard switching conditions. The system is designed to operate a single power switch and a single

TEM Horn Antenna Design Principles

January 23, 2007
Author(s)
Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Nino Canales, Benjamin Davis, Jason Veneman
The National Institute of Standards and Technology has developed several ultra-wideband, TEM Horn antennas with phase linearity, short impulse duration, and a near constant antenna factor. These are time-domain antennas used to measure impulsive fields

Complex permittivity measurements of planar building materials using a UWB free-field antenna measurement system

January 1, 2007
Author(s)
Ben N. Davis, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, James R. Baker-Jarvis, Michael D. Janezic
Building materials are often incorporated into complex, multi-layer macrostructures that are simply not amenable to measurements using coax or waveguide sample holders. In response to this, an ultra-wideband free-field measurement system has been developed

Strain-Induced Grain Growth during Rapid Thermal Cycling of Aluminum Interconnects

January 1, 2007
Author(s)
Robert Keller, Roy H. Geiss, Nicholas Barbosa, Andrew Slifka, David T. Read
We demonstrate by use of automated electron backscatter diffraction (EBSD) the rapid growth of grains in non-passivated, sputtered Al-1Si interconnects during 200 Hz thermal cycling induced by alternating electric current. Mean grain diameters were

Dynamic Lorentz Microscopy of Micromagnetic Structure in Magnetic Tunnel Junctions

November 20, 2006
Author(s)
Justin Shaw, R.H. Geiss, Stephen E. Russek
Lorentz microscopy was used to study the micromagnetic structure and magnetization reversal in magnetic tunnel junctions (MTJs) fabricated with different processing conditions including a preoxidation process. The authors find that the free layer in a MTJ

Modeling MEMS Microhotplate Structures With SystemC

October 25, 2006
Author(s)
Ankush Varma, Muhammad Afridi, Akin Akturk, Paul Klein, Allen R. Hefner Jr., Bruce Jacob
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use highlevel system design languages, such as SystemC, to model only the digital parts of a system. This is a significant limitation, since it makes key system
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