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Verification of an EMC facility retro fit using time domain and field uniformity measurements



Dennis G. Camell, Michael Taylor, Robert T. Johnk, Benjamin Davis


This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of insertion data was used to compare before and after measurements of the chamber surfaces. A free space reference provided improved data fidelity. After the update a standard IEC 61000-4-3 A1 test volume uniformity assessment was performed. These results show that the RF absorber retro fit resulted in improved radiated emissions and immunity performance.
Proceedings Title
IEEE Electromagnetic Compatibility (EMC) Symp.
Conference Dates
July 8-14, 2007
Conference Location
Honolulu, HI
Conference Title
IEEE International Symposium on EMC


EMC compliance chamber, field uniformity, retro-fit, time domain, time gating, ultra wideband, verification


Camell, D. , Taylor, M. , Johnk, R. and Davis, B. (2007), Verification of an EMC facility retro fit using time domain and field uniformity measurements, IEEE Electromagnetic Compatibility (EMC) Symp., Honolulu, HI (Accessed April 19, 2024)
Created July 8, 2007, Updated February 19, 2017