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PUBLICATIONS

Verification of an EMC facility retro fit using time domain and field uniformity measurements

Published

Author(s)

Dennis G. Camell, Michael Taylor, Robert T. Johnk, Benjamin Davis

Abstract

This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of insertion data was used to compare before and after measurements of the chamber surfaces. A free space reference provided improved data fidelity. After the update a standard IEC 61000-4-3 A1 test volume uniformity assessment was performed. These results show that the RF absorber retro fit resulted in improved radiated emissions and immunity performance.
Proceedings Title
IEEE Electromagnetic Compatibility (EMC) Symp.
Conference Dates
July 8-14, 2007
Conference Location
Honolulu, HI
Conference Title
IEEE International Symposium on EMC
Pub Type
Conferences

Keywords

EMC compliance chamber, field uniformity, retro-fit, time domain, time gating, ultra wideband, verification
Advanced communications, Electronics and Electromagnetics

Citation

Camell, D. , Taylor, M. , Johnk, R. and Davis, B. (2007), Verification of an EMC facility retro fit using time domain and field uniformity measurements, IEEE Electromagnetic Compatibility (EMC) Symp., Honolulu, HI (Accessed March 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 8, 2007, Updated February 19, 2017