NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Nino Canales, Benjamin Davis, Jason Veneman
Abstract
The National Institute of Standards and Technology has developed several ultra-wideband, TEM Horn antennas with phase linearity, short impulse duration, and a near constant antenna factor. These are time-domain antennas used to measure impulsive fields with minimal distortion. This combination of characteristics make this an ideal horn for separating events in the time domain thus obtaining an accurate frequency response from nearby scattering objects or to represent complicated antenna patterns or frequency outputs from sources. This report describes the development of each antenna, their characteristics, numerical modeling applied to each antenna to study various aspects of design, and various measurement applications of these antennas. These applications include site attenuation measurements, chamber evaluations, radar imaging studies, and aircraft shielding evaluations. This report is intended for those who wish to build or use the technology developed at NIST.
Grosvenor, C.
, Johnk, R.
, Novotny, D.
, Canales, N.
, Davis, B.
and Veneman, J.
(2007),
TEM Horn Antenna Design Principles, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.1544
(Accessed October 10, 2025)