Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

On-Wafer Measurement of Transistor Noise Parameters at NIST

Published

Author(s)

James P. Randa, Dave K. Walker

Abstract

NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
56
Issue
2

Keywords

on-wafer measurement, noise measurement, transistor noise parameters, uncertainty analysis

Citation

Randa, J. and Walker, D. (2007), On-Wafer Measurement of Transistor Noise Parameters at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32348 (Accessed April 19, 2024)
Created March 31, 2007, Updated October 12, 2021