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On-Wafer Measurement of Transistor Noise Parameters at NIST
Published
Author(s)
James P. Randa, Dave K. Walker
Abstract
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Citation
IEEE Transactions on Instrumentation and Measurement
Randa, J.
and Walker, D.
(2007),
On-Wafer Measurement of Transistor Noise Parameters at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32348
(Accessed October 16, 2025)