Randa, J.
and Walker, D.
(2007),
On-Wafer Measurement of Transistor Noise Parameters at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32348
(Accessed January 26, 2025)
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On-Wafer Measurement of Transistor Noise Parameters at NIST
Published
Author(s)
,
Abstract
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
56
Issue
2
Pub Type
Journals
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Keywords
on-wafer measurement, noise measurement, transistor noise parameters, uncertainty analysis
Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2007, Updated October 12, 2021