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PUBLICATIONS

On-Wafer Measurement of Transistor Noise Parameters at NIST

Published

Author(s)

James P. Randa, Dave K. Walker

Abstract

NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
56
Issue
2
Pub Type
Journals

Download Paper

Local Download

Keywords

on-wafer measurement, noise measurement, transistor noise parameters, uncertainty analysis
Semiconductors, Electronics, Electromagnetics and Advanced communications

Citation

Randa, J. and Walker, D. (2007), On-Wafer Measurement of Transistor Noise Parameters at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32348 (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 31, 2007, Updated October 12, 2021
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