TY  - JOUR
AU  - James Randa
AU  - Dave Walker
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2007-04-01 00:04:00
LA  - en
M1  - 56
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2007
TI  - On-Wafer Measurement of Transistor Noise Parameters at NIST
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32348
ER  -