NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Physics-based Numerical Simulation for Design of High-Voltage, Extremely-High Current Density SiC Power Devices
Published
Author(s)
Leonardo Hillkirk, Allen R. Hefner Jr., Robert W. Dutton
Abstract
This paper presents a selection of results from numerical studies addressing various problems highly relevant to the operation of SiC power devices in power systems such as the speed optimization of high-voltage SiC PiN diodes and the operation of SiC thyristors under extremely- high-current pulse-power conditions. Various methods used to optimize the reverse-recovery performance of 4H-SiC PiN power diodes are studied, including base life time control, emitter efficiency reduction, and regional lifetime control. Pulse-power thyristors are also simulated to determine the limits of reliable performance due to self-heating-induced failure.
Proceedings Title
International Semiconductor Device Research Symposium
High voltage, High Current Density Semiconductor Power Devices, Electro-Thermal Transient Numerical Simulation, Reverse-Recovery Devise Optimization, Pulsed-Power Circuit Switching.
Hillkirk, L.
, Hefner Jr., A.
and Dutton, R.
(2007),
Physics-based Numerical Simulation for Design of High-Voltage, Extremely-High Current Density SiC Power Devices, International Semiconductor Device Research Symposium, College Park, MD, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32841
(Accessed October 15, 2025)