Remley, C.
and Schreurs, D.
(2007),
Key nonlinear measurement events, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMW.2007.383304
(Accessed May 23, 2025)
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Key nonlinear measurement events
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Abstract
In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users' Forum - designed to let participants learn about and discuss issues related to large-signal and nonlinear measurements. Because new methods and applications of nonlinear measurements are being developed at a rapid pace, these events were organized to provide a forum where bench-level engineers and the research community alike could learn about the latest techniques and technologies and share experiences.Citation
IEEE Microwave Magazine
Volume
8
Issue
4
Pub Type
Journals
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Created August 1, 2007, Updated January 27, 2020