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PUBLICATIONS

Key nonlinear measurement events

Published

Author(s)

Catherine A. Remley, Dominique Schreurs

Abstract

In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users' Forum - designed to let participants learn about and discuss issues related to large-signal and nonlinear measurements. Because new methods and applications of nonlinear measurements are being developed at a rapid pace, these events were organized to provide a forum where bench-level engineers and the research community alike could learn about the latest techniques and technologies and share experiences.
Citation
IEEE Microwave Magazine
Volume
8
Issue
4
Pub Type
Journals

Download Paper

https://doi.org/10.1109/MMW.2007.383304
Advanced communications and Electronics

Citation

Remley, C. and Schreurs, D. (2007), Key nonlinear measurement events, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMW.2007.383304 (Accessed October 9, 2025)

Issues

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Created August 1, 2007, Updated January 27, 2020
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