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Conferences

Mobile Agent Attack Resistant Distributed Hierarchical Intrusion Detection Systems

September 8, 1999

Author(s)

Peter M. Mell, Mark McLarnon

Distributed intrusion detection systems are especially vulnerable to attacks since, typically, each component resides at a static location and components are...

The 1999 NIST Speaker Recognition Evaluation, Using Summed Two-Channel Telephone Data for Speaker Detection and Speaker Tracking

September 5, 1999

Author(s)

Mark A. Przybocki, Alvin F. Martin

The 1999 NIST Speaker Recognition Evaluation encompassed three tasks: one-speaker detection, two-speaker detection, and speaker tracking. All tasks were...

Multimode Fiber Transceiver Launch Distribution: Results of an Industry Round Robin

September 1, 1999

Author(s)

John B. Schlager, M. J. Hackert, M. Pepeljugoski, Mike Murphy, R. Neumann, J. Gwinn

An industry round robin conducted by the Telecommunications Industry Association FO-2.2 Task Group on the Modal Dependence of Bandwidth demonstrates good inter...

Non-Intrusive Scanning Technology for Construction Assessment

September 1, 1999

Author(s)

Geraldine S. Cheok, William C. Stone

Work at the National Institute of Standards and Technology on laser radar imaging of a construction site is described. The objective of the research is to make...

Photometry The CIE V(l) Function and What Can Be Learned from Photometry

September 1, 1999

Author(s)

Yoshihiro Ohno, E A. Thompson

The V(l) function, used in photometry, is an average action spectrum for the visual response of the human eye, and the matching of the spectral responsivity of...

Thermophysical Properties of Natural Refrigerants

September 1, 1999

Author(s)

Joe W. Magee

Natural refrigerants are candidates to replace halogenated hydrocarbons as working fluids in refrigeration systems. This class of substances is loosely defined...

ITS-90 Calibration of Radiometers Using Wire/Thin-film Thermocouples in the NIST RTP Tool: Effective Emissivity Modeling

September 1, 1999

Author(s)

Benjamin K. Tsai, D P. DeWitt

Models were developed to estimate the wafer effective emissivity as a function of the optical properties and geometrical configuration of the wafer and chamber...

Effect of AIN Encapsulate in High-Temperature Annealing on Ion-Implanted SiC as Characterized by SIMS

September 1, 1999

Author(s)

P Chi, E Handy, M V. Rao

Silicon carbide has been intensively studied due to its chemical and thermal stability and its wide band-gap characteristics that make this material attractive...

Critical Region Vapor-Liquid Equilibrium Model of Ammonia-Water

September 1, 1999

Author(s)

James C. Rainwater, R Tillner-Roth

Two distinct thermodynamic models, the modified Leung-Griffths (MLG) model and a multiparameter equation of state explicit in Helmholtz energy, are used to...

Digital Library Support for Engineering Design and Manufacturing

September 1, 1999

Author(s)

William Regli

This paper describes our initial efforts to deploy a digital library to support engineering design and manufacturing. This experimental testbed, The Engineeting...

Enhancing Collaboration using an Internet Integrated Workbench

September 1, 1999

Author(s)

Robert Allen, Srinivas Nidamarthi, S P. Regalla, Ram D. Sriram

We report on our experience using an Internet-based collaborative environment to enhance the design and manufacturing process of a custom-designed artifact...

Simulation of Graded Video Impairment by Weighted Summation: Validation of the Methodology

September 1, 1999

Author(s)

John M. Libert, Charles D. Fenimore, Peter Roitman

The investigation examines two methodologies by which to control the impairment level of digital video test materials. Such continuous fine-tuning of video...

Results from the 1999 NIST Mixed-Stain Study #2 DNA Quantitation, Differential Extraction and Identification of the Unknown Contributors

September 1, 1999

Author(s)

Margaret C. Kline, Janette W. Redman, David L. Duewer, D J. Reeder

The National Institute of Standards and Technology (NIST) has provided a number of educational interlaboratory exercises to the forensic community. The recent...

A Standards-Based Approach to Integrating Information Across the Electronics Manufacturing Supply Network

September 1, 1999

Author(s)

Barbara L. Goldstein, A, . A. Dugenske

The Representation of Function in Computer-Based Design

September 1, 1999

Author(s)

Simon Sykman, Ram D. Sriram, J Racz

This paper proposes a standardized representation of function for use by the research community, industry, and eventually commercial software vendors. This...

Standards-Based Software Testing in a Net-Centric World

September 1, 1999

Author(s)

KC Morris, David Flater

Automation for product development and manufacturing is changing to take advantage of the recent expansion of the Internet and the computing technologies...

The Use of XML to Describe Function and Taxonomies in Computer-based Design

September 1, 1999

Author(s)

Simon Sykman, Ram D. Sriram, Jocelyn Senfaute

This paper presents a mapping of a standardized representation of a function, consisting of schemata for functions and associated flows. Along with taxonomies...

Conceptual Design for Assembly

September 1, 1999

Author(s)

V Lombeyda, William Regli

This paper presents an approach to support computer-aided conceptual design of mechatronic assemblies in a collaborative, multi-user environment. We describe a...

Incoporating Process Planning into Conceptual Design

September 1, 1999

Author(s)

Shaw C. Feng, Gordon A. Shaw, Walter W. Nederbragt, Serge Kaing, Ram D. Sriram

This paper describes recent developments in the Design and Process Planning Integration (DPPI) project at the National Institute of Standards and Technology...

Towards Unambiguous Specifications: Five Alternative Job Control Models for An Object-Oriented, Hierarchical Shop Control System

September 1, 1999

Author(s)

David Flater, Edward J. Barkmeyer Jr., Evan K. Wallace

In a distributed, object-oriented, hierarchical shop control system, there are many ways of organizing the interactions between supervisory controllers and...

Spectroscopic Ellipsometry of Ta₂0₅ On Si, in Ultrathin SiO₂ and High-K Materials for ULSI Gate Dielectrics, edited by H. R. Huff, C. A. Richter, M. L. Green, G. Lucovsky, and T. Hattori

September 1, 1999

Author(s)

Curt A. Richter, Nhan Van Nguyen, G A. Alers

In this paper, we present the results of spectroscopic ellipsometry (SE) studies of Ta 20 5 films on Si. Based on these results, we have experimentally...

Intercomparison of SEM, AFM, and Electrical Linewidths

September 1, 1999

Author(s)

John S. Villarrubia, R. Dixon, S. Jones, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell

Measurements of the Zero-Dispersion Wavelength in Multimode Fibers Using a Single Low-Cost Sled Source

September 1, 1999

Author(s)

John B. Schlager, Douglas L. Franzen

We have developed a frequency-domain phase shift system for measuring the zero-dispersion wavelength of multimode optical fibers under overfilled launching...

Ultrathin SiO₂ and High-K Materials for ULSI Gate Dielectrics

September 1, 1999

Author(s)

H. R. Huff, Curt A. Richter, M. L. Green, G. Lucovsky, T. Hattori

Multifunctional Optical In Situ Monitoring of Semiconductor Film Growth

September 1, 1999

Author(s)

Kristine A. Bertness, S. P. Hays, Robert K. Hickernell

We have modifed a normal-incidence optical reflectance spectroscopy system to allow rapid switching between the measurement of sample reflectance and sample...

Hybrid Fiber Grating and Molecular Absorption Multiple Wavelength Reference

September 1, 1999

Author(s)

William C. Swann, M. A. Hubbard, Sarah L. Gilbert

The development of dense wavelength division multiplexed systems at wavelengths between 1300 and 1600 nm has created a demand for wavelength references...