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Flat Panel Display Metrology -- Less than Meets the Eye

Published

Author(s)

Edward F. Kelley

Abstract

Accurate measurement of electronic displays has become important in recent years owing to the advances in flat panel display technologies. A well-defined language is needed to specify, evaluate, and compare display technologies and their suitability to tasks. Such a specification language depends upon an unambiguous metrology being firmly in place to provide a level playing field. We will review some of the unanticipated complications that have arisen in simple measurements such as contrast as well as more complicated measurements such as display reflection properties.
Proceedings Title
Proc. 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 11-15, 1999
Conference Location
Charlotte, NC

Keywords

contrast, display measurements, FPD metrology, flat panel displays, reflection, veiling glare

Citation

Kelley, E. (1999), Flat Panel Display Metrology -- Less than Meets the Eye, Proc. 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Charlotte, NC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5933 (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 1999, Updated February 19, 2017