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A Comparison of 1 T Ω} and 10 T Ω} High-Resistance Standards Between NIST and Sandia

Published

Author(s)

Dean G. Jarrett, Ronald F. Dziuba, Marlin E. Kraft

Abstract

NIST-built 10 T ω and commercial 1 T ω standard resistors were hand carried between NIST and Sandia for a high resistance comparison. The comparison tested the ruggedness of the new NIST-built standard resistors, provided a check of the scaling between the two laboratories, supported measurements to reestablish NIST calibration services at 10 T ω and 100 T ω, and demonstrated the possibility of establishing a NIST high resistance measurement assurance program (MAP). The comparison has demonstrated agreement on the order of 0.07% which is within the expanded uncertainties (coverage factor = 2) of NIST and Sandia at 1 T ω and 10 T ω.
Proceedings Title
1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 11-16, 1999
Conference Location
Charlotte, NC, USA
Conference Title
National Conference of Standards Laboratories (NCSL)

Keywords

comparison, high resistance, measurement, standard resistor, teraohmmeter, transport standards

Citation

Jarrett, D. , Dziuba, R. and Kraft, M. (1999), A Comparison of 1 T {Ω} and 10 T {Ω} High-Resistance Standards Between NIST and Sandia, 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Charlotte, NC, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30157 (Accessed May 22, 2024)

Issues

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Created July 31, 1999, Updated October 12, 2021