Jarrett, D.
, Dziuba, R.
and Kraft, M.
(1999),
A Comparison of 1 T {Ω} and 10 T {Ω} High-Resistance Standards Between NIST and Sandia, 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Charlotte, NC, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30157
(Accessed April 26, 2024)
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A Comparison of 1 T Ω} and 10 T Ω} High-Resistance Standards Between NIST and Sandia
Published
Author(s)
, Ronald F. Dziuba,
Abstract
NIST-built 10 T ω and commercial 1 T ω standard resistors were hand carried between NIST and Sandia for a high resistance comparison. The comparison tested the ruggedness of the new NIST-built standard resistors, provided a check of the scaling between the two laboratories, supported measurements to reestablish NIST calibration services at 10 T ω and 100 T ω, and demonstrated the possibility of establishing a NIST high resistance measurement assurance program (MAP). The comparison has demonstrated agreement on the order of 0.07% which is within the expanded uncertainties (coverage factor = 2) of NIST and Sandia at 1 T ω and 10 T ω.Proceedings Title
1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 11-16, 1999
Conference Location
Charlotte, NC, USA
Conference Title
National Conference of Standards Laboratories (NCSL)
Pub Type
Conferences
Download Paper
Keywords
comparison, high resistance, measurement, standard resistor, teraohmmeter, transport standards
Citation
Created July 31, 1999, Updated October 12, 2021