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Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

Published

Author(s)

Mark R. VanLandingham, Xiaohong Gu, D T. Raghavan, Tinh Nguyen

Abstract

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing hetrogeneities in the polymer microstructure. The capability of the AFM to measure nanoscale indentation response of polymers has also been explored recently. In this presentation, the use of the AFM to characterize multi-phase and multi-component polymer systems is discussed, with emphasis given to phase imaging and indentation results.
Proceedings Title
Proceedings of Microscopy and Microanalysis '99
Volume
5
Issue
No. 2
Conference Dates
August 1-5, 1999
Conference Location
Undefined
Conference Title
Microscopy and Microanalysis Journal

Keywords

atomic force microscopy, coatings, nanoscale indentation, phase imaging, polymer blends, polymers, thin films

Citation

VanLandingham, M. , Gu, X. , Raghavan, D. and Nguyen, T. (1999), Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope, Proceedings of Microscopy and Microanalysis '99, Undefined (Accessed July 15, 2024)

Issues

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Created July 31, 1999, Updated October 12, 2021