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Conferences

Excitons in Quantum-Dot Quantum Well Structures

January 1, 2000

Author(s)

W Jaskolski, Garnett W. Bryant

A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide

January 1, 2000

Author(s)

J H. Edgar, Larry Robins, S E. Coatney, L Liu, J Chaudhuri, K Ignatiev, Z J. Rek

The crystal structure and optical properties of AlN single crystals prepared by the sublimation-recondensation method were analyzed by cathodoluminescence (CL)

Simultaneous Measurement of Torque, Axial Normal Force and Volume Change in the NIST Torsional Dilatometer - Experiments and Analysis

January 1, 2000

Author(s)

Carl R. Schultesiz, G B. McKenna

Wear Analysis of UHMWPE Using a load Sum Method

January 1, 2000

Author(s)

M C. Shen, Stephen M. Hsu, John A. Tesk, A Christou

Investigation of N2 Plasma Effects on the Depth Profile of Hydrogen Silsesquioxane Thin Films Using High Resolution Specular X-Ray Reflectivity

January 1, 2000

Author(s)

V. J. Lee, Eric K. Lin, J K. Lan, Y L. Cheng, H C. Liou, Wen-Li Wu, Y L. Wang, M S. Feng, C G. Chao

Neutron reflectivity Measurements of Molecular Mass Effects on Polymer Mobility near the Polymer/Solid Interface

January 1, 2000

Author(s)

Eric K. Lin, D J. Pochan, Wen-Li Wu, Sushil K. Satija

Second Intercomparision of Radiation Temperature Scales Among Four National Metrological Laboratories Using a Transfer Standard Radiation Thermometer

January 1, 2000

Author(s)

F Sakuma, H Sakate, Graham Machin, J Fischer, Charles E. Gibson, B. Carol Johnson

Round-robin measurements with a transfer-standard radiation thermometer were organized by the National Research Laboratory of Metrology NRLM with the National

Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties

January 1, 2000

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers, M Dineen

The ultimate objective of instrumented indentation testing is to obtain absolute measurements of material properties and behavior. To achieve this goal

Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage

January 1, 2000

Author(s)

E Amatucci, Nicholas Dagalakis, John A. Kramar, Fredric Scire

The phenomenal growth of opto-electronic manufacturing and future applications in micro and nano manufacturing has raised the need for low-cost high performance

Recent Progress in Nanoscale Indentation of Polymers Using the AFM

January 1, 2000

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers

Regardless of the type of test, reliable indentation measurements require knowledge of the shape of the indenter tip. For indentation measurements involving sub

Interferometric Calibration of a Capacitance Displacement Sensor Over Short Displacement Ranges

January 1, 2000

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, G S. Peng, Theodore V. Vorburger

Capacitance displacement sensors, which are widely used to measure and control the true extension of piezoelectric actuators, have to be calibrated, if they are

In Situ Atomic Absorption Monitoring with Substrate Reflection

January 1, 2000

Author(s)

S. P. Hays, Robert K. Hickernell, Kristine A. Bertness

We demonstrate a technique to apply real-time optical flux monitoring by in situ atomic absorption when the only available optical path through a molecular beam

Interconnect Reliability Test Chip NIST 36: For Development of Measurement Tools & Standards

December 31, 1999

Author(s)

Harry A. Schafft

NIST 36 is a collection of interconnect reliability test structures designed by NIST in collaboration with members of JEDEC Committee JC14.2 on Wafer Level

An Evaluation of Electrical Linewidth Determination Using Cross-Bridge and Multi-Bridge Test Structures

December 31, 1999

Author(s)

Linda M. Head, Harry A. Schafft

The Multi-Bridge method is often used in the industry to measure electrical linewidths of interconnect lines because it requires less sensitive equipment than

A Resource Access Decision Service for CORBA-Based Distributed Systems

December 9, 1999

Author(s)

Konstantin Beznosov, Yi Deng, Bob Blakley, Carol Burt, John Barkley

Decoupling authorization logic from application logic allows applications with fine-grain access control requirements to be independent from a particular access

Modeling Wear of Ceramics Based on Wear Maps

December 2, 1999

Author(s)

Stephen M. Hsu, M C. Shen

Ceramics are increasingly being considered for wear resistant applications. The design and prediction of ceramics wear, however are lacking behind metals. This

Causality and Characteristic Impedance

December 2, 1999

Author(s)

Dylan F. Williams, Bradley K. Alpert

A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.

Analytical Spectroscopic Ellipsometry of Ta₂O₅ and TiO₂ for Use as High-k Gate Dielectrics

December 2, 1999

Author(s)

Curt A. Richter, Nhan Van Nguyen, G A. Alers, X Guo, Xiaorui Wang, T P. Ma, T Tamagawa

Extended abstract on Analytical Spectroscopic Ellipsometry of Ta 2O 5 and TiO 2 for Use as High-k Gate Dielectrics. Opening paragraph of abstract: There is

Nose-to-Nose Response of a 20-GHz Sampling Circuit

December 1, 1999

Author(s)

Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot

We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety

Planar Laser Induced Fluorescence Images of Supersonic Flame Structure.

December 1, 1999

Author(s)

Rodney A. Bryant, J F. Driscoll

ITS-90 Calibration of Radiometers Using Wire/Thin-film Thermocouples in the NIST RTP Tool: Experimental Procedures and Results

December 1, 1999

Author(s)

Christopher W. Meyer, D W. Allen, D P. Dewitt, Kenneth G. Kreider, F J. Lovas, B Tsai

Primary Acoustic Thermometry for Use Up to 800 K

December 1, 1999

Author(s)

Dean C. Ripple, Dana R. Defibaugh, Keith A. Gillis, Michael R. Moldover

Exposure Parameters During Studies with ELF Magnetic and Electric Fields

December 1, 1999

Author(s)

Martin Misakian

Following a brief introduction to terminology that describes power frequency and other extremely low frequency [ELF] magnetic and electric fields, a short