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Computation of Light Scattered Into Detector

Published

Author(s)

Egon Marx

Abstract

To compare the measured bidirectional reflectance distribution function (BRDF) of a rough surface to the results of a computation, we have to take into account the aperture of the detector and, more generally, the properties of the measuring instrument. We either integrate the computed angular distribution of the scattered intensity over the solid angle subtended by the detector or convolve the angular distribution with the measured instrument signature. Effects due to the detector are most important when the specular beam is large compared to the diffuse scattering and is included in the light gathered by the detector. We also have to perform such an integration to average over the variations of the scattered intensity due to speckle. We first consider a one-dimensionally rough surface and then we extend the methods to the more general isotropic, rough, flat surface.
Proceedings Title
2000 Digest of IEEE/AP-S International Symposium
Conference Location
Salt Lake City, UT

Keywords

detector, Kirchhoff approximation, light scattering, rough surface, windowing function

Citation

Marx, E. (2000), Computation of Light Scattered Into Detector, 2000 Digest of IEEE/AP-S International Symposium, Salt Lake City, UT (Accessed April 22, 2024)
Created January 1, 2000, Updated February 19, 2017