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Conferences

High-Speed Machining Frequency Response Prediction for Process Optimization

January 1, 2000

Author(s)

Tony L. Schmitz, Matthew A. Davies, Michael Kennedy

As interest in high-speed machining techniques grows among world manufacturers, efficient methods for obtaining the tool point frequency response (used as input...

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000

Author(s)

Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary

Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard...

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000

Author(s)

J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold

Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to...

Preparation and Characterization of Photopatternable BaTiO3/Polymer Composites

January 1, 2000

Author(s)

R Popielarz, C. K. Chiang, R Nozaki, Jan Obrzut

Thermal and Flammability Properties of a Silica-Pmma Nanocomposite

January 1, 2000

Author(s)

Abby W. Morgan, Joseph M. Antonucci, Mark R. VanLandingham, R H. Harris, Takashi Kashiwagi

Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods

January 1, 2000

Author(s)

A P. Smith, J C. Meredith, Eric J. Amis, Alamgir Karim

The development and application of combinatorial methods and techniques to pharmaceutical drug discovery has revolutionized the process of bringing new drugs to...

Impact of Directional Properties on the Radiometric Temperature Measurement in Rapid Thermal Processing

January 1, 2000

Author(s)

Yong Zhou, Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

Investigation of the relationship between microstructure and appearance properties of coating materials

January 1, 2000

Author(s)

L P. Sung, Maria Nadal, M E. Mcknight, J V. Nguyen, Chungsan Lin

Bidirectional Reflectance Distribution Function of Rough Silicon Wafers

January 1, 2000

Author(s)

Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

Polarimetric BRDF in the Microfacet Model: Theory and Measurements

January 1, 2000

Author(s)

R G. Priest, Thomas Germer

Excitons in Quantum-Dot Quantum Well Structures

January 1, 2000

Author(s)

W Jaskolski, Garnett W. Bryant

A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide

January 1, 2000

Author(s)

J H. Edgar, Larry Robins, S E. Coatney, L Liu, J Chaudhuri, K Ignatiev, Z J. Rek

The crystal structure and optical properties of AlN single crystals prepared by the sublimation-recondensation method were analyzed by cathodoluminescence (CL)...

Simultaneous Measurement of Torque, Axial Normal Force and Volume Change in the NIST Torsional Dilatometer - Experiments and Analysis

January 1, 2000

Author(s)

Carl R. Schultesiz, G B. McKenna

Wear Analysis of UHMWPE Using a load Sum Method

January 1, 2000

Author(s)

M C. Shen, Stephen M. Hsu, John A. Tesk, A Christou

Investigation of N2 Plasma Effects on the Depth Profile of Hydrogen Silsesquioxane Thin Films Using High Resolution Specular X-Ray Reflectivity

January 1, 2000

Author(s)

V. J. Lee, Eric K. Lin, J K. Lan, Y L. Cheng, H C. Liou, Wen-Li Wu, Y L. Wang, M S. Feng, C G. Chao

Neutron reflectivity Measurements of Molecular Mass Effects on Polymer Mobility near the Polymer/Solid Interface

January 1, 2000

Author(s)

Eric K. Lin, D J. Pochan, Wen-Li Wu, Sushil K. Satija

Second Intercomparision of Radiation Temperature Scales Among Four National Metrological Laboratories Using a Transfer Standard Radiation Thermometer

January 1, 2000

Author(s)

F Sakuma, H Sakate, Graham Machin, J Fischer, Charles E. Gibson, B. Carol Johnson

Round-robin measurements with a transfer-standard radiation thermometer were organized by the National Research Laboratory of Metrology NRLM with the National...

Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties

January 1, 2000

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers, M Dineen

The ultimate objective of instrumented indentation testing is to obtain absolute measurements of material properties and behavior. To achieve this goal...

Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage

January 1, 2000

Author(s)

E Amatucci, Nicholas Dagalakis, John A. Kramar, Fredric Scire

The phenomenal growth of opto-electronic manufacturing and future applications in micro and nano manufacturing has raised the need for low-cost high performance...

Recent Progress in Nanoscale Indentation of Polymers Using the AFM

January 1, 2000

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers

Regardless of the type of test, reliable indentation measurements require knowledge of the shape of the indenter tip. For indentation measurements involving sub...

Interferometric Calibration of a Capacitance Displacement Sensor Over Short Displacement Ranges

January 1, 2000

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, G S. Peng, Theodore V. Vorburger

Capacitance displacement sensors, which are widely used to measure and control the true extension of piezoelectric actuators, have to be calibrated, if they are...

In Situ Atomic Absorption Monitoring with Substrate Reflection

January 1, 2000

Author(s)

S. P. Hays, Robert K. Hickernell, Kristine A. Bertness

We demonstrate a technique to apply real-time optical flux monitoring by in situ atomic absorption when the only available optical path through a molecular beam...

Interconnect Reliability Test Chip NIST 36: For Development of Measurement Tools & Standards

December 31, 1999

Author(s)

Harry A. Schafft

NIST 36 is a collection of interconnect reliability test structures designed by NIST in collaboration with members of JEDEC Committee JC14.2 on Wafer Level...

An Evaluation of Electrical Linewidth Determination Using Cross-Bridge and Multi-Bridge Test Structures

December 31, 1999

Author(s)

Linda M. Head, Harry A. Schafft

The Multi-Bridge method is often used in the industry to measure electrical linewidths of interconnect lines because it requires less sensitive equipment than...

A Resource Access Decision Service for CORBA-Based Distributed Systems

December 9, 1999

Author(s)

Konstantin Beznosov, Yi Deng, Bob Blakley, Carol Burt, John Barkley

Decoupling authorization logic from application logic allows applications with fine-grain access control requirements to be independent from a particular access...

Modeling Wear of Ceramics Based on Wear Maps

December 2, 1999

Author(s)

Stephen M. Hsu, M C. Shen

Ceramics are increasingly being considered for wear resistant applications. The design and prediction of ceramics wear, however are lacking behind metals. This...

Causality and Characteristic Impedance

December 2, 1999

Author(s)

Dylan F. Williams, Bradley K. Alpert

A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.

Analytical Spectroscopic Ellipsometry of Ta₂O₅ and TiO₂ for Use as High-k Gate Dielectrics

December 2, 1999

Author(s)

Curt A. Richter, Nhan Van Nguyen, G A. Alers, X Guo, Xiaorui Wang, T P. Ma, T Tamagawa

Extended abstract on Analytical Spectroscopic Ellipsometry of Ta 2O 5 and TiO 2 for Use as High-k Gate Dielectrics. Opening paragraph of abstract: There is...

Nose-to-Nose Response of a 20-GHz Sampling Circuit

December 1, 1999

Author(s)

Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot

We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety...

Planar Laser Induced Fluorescence Images of Supersonic Flame Structure.

December 1, 1999

Author(s)

Rodney A. Bryant, J F. Driscoll

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