VanLandingham, M.
, Villarrubia, J.
, Meyers, G.
and Dineen, M.
(2000),
Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties, Proceedings of Microscopy and Microanalysis, Philadelphia, PA, USA
(Accessed October 6, 2024)
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Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties
Published
Author(s)
Mark R. VanLandingham, , G Meyers, M Dineen
Abstract
The ultimate objective of instrumented indentation testing is to obtain absolute measurements of material properties and behavior. To achieve this goal, accurate knowledge of the shape of the indenter tip is required. For indentation measurements involving sub-micrometer scale contacts, accurate knowledge of the tip shape can be difficult to achieve. In this paper, a technique referred to as blind reconstruction is applied to the measurement of tip shapes of indenters used with the atomic force microscope to indent polymeric materials.Proceedings Title
Proceedings of Microscopy and Microanalysis
Volume
6(2)
Conference Dates
August 13-17, 2000
Conference Location
Philadelphia, PA, USA
Pub Type
Conferences
Keywords
AFM, elastic modulus, force mode, tip shape calibration
Citation
Issues
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Created December 31, 1999, Updated October 12, 2021