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Conferences

Preparation and Characterization of Photopatternable BaTiO3/Polymer Composites

January 1, 2000

Author(s)

R Popielarz, C. K. Chiang, R Nozaki, Jan Obrzut

Recent Progress in Nanoscale Indentation of Polymers Using the AFM

January 1, 2000

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers

Regardless of the type of test, reliable indentation measurements require knowledge of the shape of the indenter tip. For indentation measurements involving sub

1/F Frequency Noise of 2 GHz High Q Thin Film Sapphire Resonators

January 1, 2000

Author(s)

Eva Ferre-Pikal, M C. Aramburo, F L. Walls, K M. Lakin

Thermal and Flammability Properties of a Silica-Pmma Nanocomposite

January 1, 2000

Author(s)

Abby W. Morgan, Joseph M. Antonucci, Mark R. VanLandingham, R H. Harris, Takashi Kashiwagi

Interferometric Calibration of a Capacitance Displacement Sensor Over Short Displacement Ranges

January 1, 2000

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, G S. Peng, Theodore V. Vorburger

Capacitance displacement sensors, which are widely used to measure and control the true extension of piezoelectric actuators, have to be calibrated, if they are

Effect of Aliasing on Spurs and PM Noise in Frequency Dividers

January 1, 2000

Author(s)

A Sengupta, F L. Walls

Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods

January 1, 2000

Author(s)

A P. Smith, J C. Meredith, Eric J. Amis, Alamgir Karim

The development and application of combinatorial methods and techniques to pharmaceutical drug discovery has revolutionized the process of bringing new drugs to

In Situ Atomic Absorption Monitoring with Substrate Reflection

January 1, 2000

Author(s)

S. P. Hays, Robert K. Hickernell, Kristine A. Bertness

We demonstrate a technique to apply real-time optical flux monitoring by in situ atomic absorption when the only available optical path through a molecular beam

Comparing Primary Frequency Standards at NIST and PTB

January 1, 2000

Author(s)

L M. Nelson, Judah Levine, P Hetzel

Impact of Directional Properties on the Radiometric Temperature Measurement in Rapid Thermal Processing

January 1, 2000

Author(s)

Yong Zhou, Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

Calibration of Carrier Phase GPS Receivers

January 1, 2000

Author(s)

L M. Nelson, K M. Larson, Judah Levine

Investigation of the relationship between microstructure and appearance properties of coating materials

January 1, 2000

Author(s)

L P. Sung, Maria Nadal, M E. Mcknight, J V. Nguyen, Chungsan Lin

Review of GPS Carrier-Phase and Two-Way Satellite Time Transfer Measurement Results between Schriever Air Force Base and the United States Naval Observatory

January 1, 2000

Author(s)

L M. Nelson, K M. Larson, Judah Levine

Bidirectional Reflectance Distribution Function of Rough Silicon Wafers

January 1, 2000

Author(s)

Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt

Comparison of atomic frequency standards at NIST and PTB using carrier-phase GPS, ed. by L.A. Breakiron

January 1, 2000

Author(s)

L M. Nelson, Judah Levine, Tom Parker, K M. Larson, P Hetzel, Juergen Becker

Polarimetric BRDF in the Microfacet Model: Theory and Measurements

January 1, 2000

Author(s)

R G. Priest, Thomas Germer

The Relativistic Red Shift with 2 × 10^-17 Uncertainty at NIST, Boulder, CO USA

January 1, 2000

Author(s)

N K. Pavlis , Marc A. Weiss

Excitons in Quantum-Dot Quantum Well Structures

January 1, 2000

Author(s)

W Jaskolski, Garnett W. Bryant

Interconnect Reliability Test Chip NIST 36: For Development of Measurement Tools & Standards

December 31, 1999

Author(s)

Harry A. Schafft

NIST 36 is a collection of interconnect reliability test structures designed by NIST in collaboration with members of JEDEC Committee JC14.2 on Wafer Level

An Evaluation of Electrical Linewidth Determination Using Cross-Bridge and Multi-Bridge Test Structures

December 31, 1999

Author(s)

Linda M. Head, Harry A. Schafft

The Multi-Bridge method is often used in the industry to measure electrical linewidths of interconnect lines because it requires less sensitive equipment than

A Resource Access Decision Service for CORBA-Based Distributed Systems

December 9, 1999

Author(s)

Konstantin Beznosov, Yi Deng, Bob Blakley, Carol Burt, John Barkley

Decoupling authorization logic from application logic allows applications with fine-grain access control requirements to be independent from a particular access

Modeling Wear of Ceramics Based on Wear Maps

December 2, 1999

Author(s)

Stephen M. Hsu, M C. Shen

Ceramics are increasingly being considered for wear resistant applications. The design and prediction of ceramics wear, however are lacking behind metals. This

Causality and Characteristic Impedance

December 2, 1999

Author(s)

Dylan F. Williams, Bradley K. Alpert

A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.

Analytical Spectroscopic Ellipsometry of Ta₂O₅ and TiO₂ for Use as High-k Gate Dielectrics

December 2, 1999

Author(s)

Curt A. Richter, Nhan Van Nguyen, G A. Alers, X Guo, Xiaorui Wang, T P. Ma, T Tamagawa

Extended abstract on Analytical Spectroscopic Ellipsometry of Ta 2O 5 and TiO 2 for Use as High-k Gate Dielectrics. Opening paragraph of abstract: There is