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Electronic Display and Imaging Metrology at NIST

Published

Author(s)

Edward F. Kelley

Abstract

The activities at the National Institute of Standards and Technology (NIST) in the areas of photonics, optoelectronics, imaging, displays, photometry and colorimetry are broadband and ubiquitous. The main emphasis of this presentation is on the activities of the Flat Panel Display Laboratory at NIST. However, we attempt to summarize the NIST photonics activities here by providing an overview of the divisions, groups, and some projects involved in photonics and imaging research. This document is divided into three parts. Flat Panel Display Laboratory (FPDL) at NIST: This is the slide presentation that reviews some of the metrological activities of the FPDL at NIST. NIST Activities Summary: The second section provides an overview of the divisions and groups at NIST that are involved in photonics, imaging, optoelectronics, displays, photometry and colorimetry. Web and email references are presented for further review. Obtain the electronic form of this document that contains active hyperlinks as mentioned above. Imaging and Photonics Projects at NIST: a number of projects are summarized that you may find interesting and may be of service to your activies. (These pages will have the NIST logo in the upper left hand corner.) We would encourage you to become familiar with the NIST activities that can be used to support your research and development of photonics and services.
Proceedings Title
Photonics West 2000 Conf., IS&T/SPIE 12th Intl. Symposium on Electronic Imaging
Conference Location
San Jose, CA

Keywords

colorimetry, electronic display metrology, imaging, optoelectronics, photometry, photonics

Citation

Kelley, E. (2000), Electronic Display and Imaging Metrology at NIST, Photonics West 2000 Conf., IS&T/SPIE 12th Intl. Symposium on Electronic Imaging, San Jose, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29392 (Accessed May 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2000, Updated February 19, 2017