Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping
Ryna B. Marinenko, Jennifer R. Verkouteren, David S. Bright
The use of digital electron microprobe x-ray compositional mapping using wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification fo element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.
Material Reserach Society 2000 Fall Proceedings
November 27-December 1, 1999
electron microprobe, quantitative compostional mapping, x-ray compostional mapping
, Verkouteren, J.
and Bright, D.
Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping, Material Reserach Society 2000 Fall Proceedings
, Boston, MA
(Accessed February 26, 2024)