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Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping

Published

Author(s)

Ryna B. Marinenko, Jennifer R. Verkouteren, David S. Bright

Abstract

The use of digital electron microprobe x-ray compositional mapping using wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification fo element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.
Proceedings Title
Material Reserach Society 2000 Fall Proceedings
Conference Dates
November 27-December 1, 1999
Conference Location
Boston, MA

Keywords

electron microprobe, quantitative compostional mapping, x-ray compostional mapping

Citation

Marinenko, R. , Verkouteren, J. and Bright, D. (2000), Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping, Material Reserach Society 2000 Fall Proceedings , Boston, MA (Accessed February 26, 2024)
Created January 1, 2000, Updated February 19, 2017