Ohno, Y.
(2000),
CIE Fundamentals for Color Measurements, IS&T NIP16 Intl. Conf. on Digital Printing Technologies , Vancouver, CA
(Accessed December 2, 2023)
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CIE Fundamentals for Color Measurements
Published
Author(s)
Proceedings Title
IS&T NIP16 Intl. Conf. on Digital Printing Technologies
Conference Dates
October 15-20, 2000
Conference Location
Vancouver, CA
Conference Title
Proc., IS&T NIP16 Intl. Conf. on Digital Printing Technologies
Pub Type
Conferences
Citation
Created January 1, 2000, Updated February 17, 2017