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CIE Fundamentals for Color Measurements

Published

Author(s)

Yoshihiro Ohno
Proceedings Title
IS&T NIP16 Intl. Conf. on Digital Printing Technologies
Conference Dates
October 15-20, 2000
Conference Location
Vancouver, CA
Conference Title
Proc., IS&T NIP16 Intl. Conf. on Digital Printing Technologies

Citation

Ohno, Y. (2000), CIE Fundamentals for Color Measurements, IS&T NIP16 Intl. Conf. on Digital Printing Technologies , Vancouver, CA (Accessed July 24, 2024)

Issues

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Created January 1, 2000, Updated February 17, 2017