Tsai, B.
, Meyer, C.
and Lovas, F.
(2000),
Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed, 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors, Gaithersburg, MD
(Accessed May 18, 2024)
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Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed
Published
Author(s)
, C W. Meyer,
Proceedings Title
8th Intl. Conf. on Advanced Thermal Processing of Semiconductors
Conference Location
Gaithersburg, MD
Conference Title
Proc. 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2000, Updated February 17, 2017