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Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed

Published

Author(s)

Benjamin K. Tsai, C W. Meyer, Francis J. Lovas
Proceedings Title
8th Intl. Conf. on Advanced Thermal Processing of Semiconductors
Conference Location
Gaithersburg, MD
Conference Title
Proc. 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors

Citation

Tsai, B. , Meyer, C. and Lovas, F. (2000), Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed, 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors, Gaithersburg, MD (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2000, Updated February 17, 2017