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Force Metrology at NIST



Simone L. Yaniv, Thomas W. Bartel


This paper describes the measurements services, the instrumentation and procedures available for force metrology at the National Institute of Standards and Technology, USA. The uncertainty of the voltage ratio indicating system for strain gage load cells are discussed.
Proceedings Title
Proceedings of the XVI IMEKO World Congress
Conference Dates
September 25-28, 2000
Conference Location
Vienna, AU
Conference Title
XVI IMEKO World Congress


Deadweight machine, Force metrology, Force Standards, Uncertainty


Yaniv, S. and Bartel, T. (2000), Force Metrology at NIST, Proceedings of the XVI IMEKO World Congress, Vienna, AU (Accessed May 21, 2024)


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Created January 1, 2000, Updated February 19, 2017