Yaniv, S.
and Bartel, T.
(2000),
Force Metrology at NIST, Proceedings of the XVI IMEKO World Congress, Vienna, AU
(Accessed December 23, 2025)
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Force Metrology at NIST
Published
Author(s)
,
Abstract
This paper describes the measurements services, the instrumentation and procedures available for force metrology at the National Institute of Standards and Technology, USA. The uncertainty of the voltage ratio indicating system for strain gage load cells are discussed.Proceedings Title
Proceedings of the XVI IMEKO World Congress
Volume
pending
Conference Dates
September 25-28, 2000
Conference Location
Vienna, AU
Conference Title
XVI IMEKO World Congress
Pub Type
Conferences
Keywords
Deadweight machine, Force metrology, Force Standards, Uncertainty
Citation
Issues
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Created January 1, 2000, Updated February 19, 2017