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PUBLICATIONS

Force Metrology at NIST

Published

Author(s)

Simone L. Yaniv, Thomas W. Bartel

Abstract

This paper describes the measurements services, the instrumentation and procedures available for force metrology at the National Institute of Standards and Technology, USA. The uncertainty of the voltage ratio indicating system for strain gage load cells are discussed.
Proceedings Title
Proceedings of the XVI IMEKO World Congress
Volume
pending
Conference Dates
September 25-28, 2000
Conference Location
Vienna, AU
Conference Title
XVI IMEKO World Congress
Pub Type
Conferences

Keywords

Deadweight machine, Force metrology, Force Standards, Uncertainty
Force metrology

Citation

Yaniv, S. and Bartel, T. (2000), Force Metrology at NIST, Proceedings of the XVI IMEKO World Congress, Vienna, AU (Accessed October 21, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 2000, Updated February 19, 2017
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