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J F. Garcia nava, Archita Hati, Craig Nelson, A Sen Gupta, F L. Walls, T Tasset
In this paper we discuss an alternate design of a self-starting conjugate regenerative divider (CRD), which uses two parallel loops instead of one series loop...
M A. Sahiner, S W. Novak, Joseph Woicik, Y. Takamura, P B. Griffin, J D. Plummer
One of the important challenges in semiconductor industry is to sustain high concentration of dopant atoms electronically active in very small areas. In...
J Fischer, M Battuello, M Sadli, M Ballico, S N. Park, P Saunders, Y Zundong, B. Carol Johnson, E Van der Ham, F Sakuma, Graham Machin, N Fox, W Li, S Ugur, M Matveyev
Recent international comparisons [1,2] and key comparisons have shown that the realization of the ITS-90 above the freezing point of silver and its...
Hiroshi Kitajima, Noboru Kagawa, Harumi Endo, Seizo Tsuruno, Joe W. Magee
Specific heat capacity at constant volume is one of the most important thermodynamic properties to develop and evaluate thermodynamic equations of state. With...
Hiroyuki Miyamoto, Hiroshi Kitajima, Noboru Kagawa, Joe W. Magee, Seizo Tsuruno, Koichi Watanabe
Experimental specific isochoric heat capacities (C v) and PρT properties for isobutane are presented that were measured with a twin-cell type adiabatic...
Shao Yang, Darryl A. Keenan, Holger Laabs, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements on excimer lasers, we have developed a system using the correlation method to measure the...
Susan Y. Lehman, Kristine A. Bertness, Joseph T. Hodges
We are using cavity ring-down spectroscopy (CRDS) to measure concentrations of water in nitrogen and, for the first time to our knowledge, in phosphine. Water...
Susan Y. Lehman, Alexana Roshko, Richard Mirin, John E. Bonevich
Three samples of self-assembled In 0.44Ga 0.56As quantum dots (QDs) grown on (001) GaAs by molecular beam epitaxy (MBE) were studied using atomic force...
Darryl A. Keenan, Holger Laabs, Shao Yang, Marla L. Dowell
To meet the semiconductor industry's demands for accurate measurements, we have developed a method to characterize the nonlinear response of 193 nm excimer...
Norman Sanford, Larry Robins, Albert Davydov, Alexander J. Shapiro, Denis V. Tsvetkov, Vladimir A. Dmitriev, Stacia Keller, Umesh Mishra, Steven P. DenBaars
Waveguide prism-coupling methods were used to measure the ordinary and extraordinary refractive indices of Al xGaN films grown on sapphire substrates by HVPE...