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Conferences

Distributed Testing of an Equipment-Level Interface Specification

Author(s)
Joseph Falco, John A. Horst, Hui-Min Huang, Thomas Kramer, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering
A test suite for an key interface within a dimensional measuring system (coordinate measuring machine or CMM) is presented. The test suite consists of test...

Multiline TRL Revealed

Author(s)
Donald C. DeGroot, Jeffrey Jargon, Roger Marks
We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper...

High-Speed Quantum Communication Testbed

Author(s)
Carl J. Williams, Xiao Tang, M Hiekkero, J Rouzard, R Lu, A Goedecke, Alan L. Migdall, Alan Mink, Anastase Nakassis, Leticia S. Pibida
We describe the current status of the NIST Quantum Communication Testbed (QCT) facility. QCT is a facility for exploring quantum communication in an enviornment...

Measurement of the Spatial Evolution of the Deprotection Reaction Front With Nanometer Resolution Using Neutron Reflectometry

Author(s)
Eric K. Lin, Sushil K. Satija, Wen-Li Wu, Christopher L. Soles, D L. Goldfarb, B C. Trinque, S D. Burns, Ronald L. Jones, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, M Angelopoulos, C G. Willson
The use of chemically amplified photoresists for the fabrication of sub-100 nm features will require spatial control with nanometer level resolution. To reach...

New NIST Photomask Linewidth Standard

Author(s)
James E. Potzick, J Pedulla, Michael T. Stocker
NIST is preparing to issue the next generation in its line of binary photomask linewidth standards. Called SRM 2059, it was developed for calibrating...
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