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Application of Self-Assembled Technology to Probe Fiber Matrix-Adhesion

Published

Author(s)

E Feresenbet, D T. Raghavan, Gale A. Holmes

Abstract

Adhesion at the fiber-matrix interface of composite is often related to a combination of factors such as mechanical interlocking, physico-chemical interactions, and chemical bonding of the fiber-matrix interphase region. We demonstrate the use of (self-assembled monolayers) SAMs technology for studying the impact of these interactions on the adhesion process. Through some unique chemistry, functionalized and non functionalized C11 and C3 chlorosilane SAMs were deposited on to E-glass fiber. The adhesion of diglycidyl ether of bisphenol-A (DGEBA) cured with meta-phenylene diamine (m-PDA) to chloro silane SAMs deposited E-glass fibers was measured by performing single fiber fragmentation test (SFFT). The extent of adhesion between the fiber and matrix was found to be dependent on the deposition process of coupling agents on E-glass fiber, carbon chain length of coupling agents, and the functional group at the end of the SAMs layer. Furthermore, the contributions to adhesion by physico-chemical interaction and covalent bonding has been individually assessed.
Proceedings Title
Self-Assembly Processes in Materials, Symposium AA | | Symposium AA Self-Assembly Processes in Materials | Materials Research Society
Volume
707
Conference Dates
October 1, 2001
Conference Location
Boston, MA
Conference Title
Materials Research Society Symposium Proceedings

Keywords

adhesion, glass fiber, interface, interface strength, interphase, matrix, self-assembled monolayer, silane coupling agent

Citation

Feresenbet, E. , Raghavan, D. and Holmes, G. (2002), Application of Self-Assembled Technology to Probe Fiber Matrix-Adhesion, Self-Assembly Processes in Materials, Symposium AA | | Symposium AA Self-Assembly Processes in Materials | Materials Research Society, Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851968 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 1, 2002, Updated February 19, 2017