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Low Scatter Optical System for Emittance and Temperature Measurements

Published

Author(s)

Sergey Mekhontsev, Leonard M. Hanssen

Abstract

The development and evaluation of an optical system for a new spectral directional emittance facility at NIST is reported. The imaging quality and signal contributions due to out-of-field-of-view scattering, commonly characterizedby the size-of-source effect (SSE) parameter, have been measured across the spectral range of 0.65 m to 4 m by three independent methods. The SSE measurement results of scatter levels not exceeding 2-3 parts in 104 are consistent and exceed the design targets. The potential application of the optical system to construction of a portable instrument with low scatter/emission and an operating spectral range of 0.65 m to 20 m are discussed.
Proceedings Title
Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP
Volume
684
Conference Dates
October 21-24, 2002
Conference Title
AIP Conference Proceedings

Keywords

emittance, mirror, optical system, pyrometry, radiometer, reflectance, scattering

Citation

Mekhontsev, S. and Hanssen, L. (2002), Low Scatter Optical System for Emittance and Temperature Measurements, Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP (Accessed August 14, 2022)
Created October 1, 2002, Updated February 17, 2017