Mekhontsev, S.
and Hanssen, L.
(2002),
Low Scatter Optical System for Emittance and Temperature Measurements, Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP
(Accessed September 16, 2024)
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Low Scatter Optical System for Emittance and Temperature Measurements
Published
Author(s)
,
Abstract
The development and evaluation of an optical system for a new spectral directional emittance facility at NIST is reported. The imaging quality and signal contributions due to out-of-field-of-view scattering, commonly characterizedby the size-of-source effect (SSE) parameter, have been measured across the spectral range of 0.65 m to 4 m by three independent methods. The SSE measurement results of scatter levels not exceeding 2-3 parts in 104 are consistent and exceed the design targets. The potential application of the optical system to construction of a portable instrument with low scatter/emission and an operating spectral range of 0.65 m to 20 m are discussed.Proceedings Title
Temperature, International Symposium | 8th | Temperature: Its Measurement and Control in Science and Industry | AIP
Volume
684
Conference Dates
October 21-24, 2002
Conference Title
AIP Conference Proceedings
Pub Type
Conferences
Keywords
emittance, mirror, optical system, pyrometry, radiometer, reflectance, scattering
Citation
Issues
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Created October 1, 2002, Updated February 17, 2017