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Michael D. Janezic, Edward Kuester, James R. Baker-Jarvis
We summarize a theoretical model for the split-cylinder resonator, based on the mode-matching method, for performing nondestructive permittivity and loss
Nelson P. Bryner, William D. Walton, I. A. Mendelssohn, Q. Lin, J. V. Mullin
Twenty-one full-scale in-situ burn experiments examined soil temperatures which marsh plants experience during in-situ burning. Two hundred sixty four plant
Semiconductor metrology developments at NIST have been conducted since the 1950s, covering a wide range of topics, including investigation of the causes of
Barry J. Bauer, R C. Hedden, Hae-Jeong Lee, Christopher L. Soles, Da-Wei Liu
Small angle neutron and x-ray scattering (SANS, SAXS) are powerful tools in determination of the pore size and content of nano-porous materials with low
The problem of determining a consensus mean and its uncertainty from the results of multiple measurement methods or laboratories is an important problem. Many
Lawrence P. Cook, Winnie K. Wong-Ng, Peter K. Schenck, Mark D. Vaudin, J Suh
Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to
Small-angle neutron scattering (SANS) contrast variation is used to characterize matrix properties and pore size in nanoporous low-k thin films. Using a vapor
Many significant new developments in cryocoolers have occurred since about 1985 that have lead to grealy improved efficiencies, lifetimes, compactness, and low
The NIST Platinum Resistance Thermometry Laboratory uses International Temperature Scale of 1990 (ITS-90) fixed-point cells to calibrate standard platinum
Zvi Boger, Douglas C. Meier, Richard E. Cavicchi, Stephen Semancik
Response data from microhotplate (MHP) sensor arrays were measured for various chemical warfare (CW) agents at several concentrations. Efficient large-scale
William G. Rippey, Timothy P. Quinn, John L. Michaloski
TECHNICAL SUMMARYIntroduction/Background SectionA system to demonstrate the transfer of weld inspection data between computer programs is described in this
Alan L. Migdall, D A. Branning, Stefania Castelletto, M J. Ware
As currently implemented, single photon sources cannot be made to producesingle photons with high probability, while simultaneously suppressingthe probability
Vincent M. Stanford, John S. Garofolo, O P. Galibert, Martial Michel, Christophe Laprun
Pervasive Computing devices, sensors, and networks, provide infrastructure for context aware smart meeting rooms that sense ongoing human activities and respond
This paper is concerned with decomposition of heptyl radicals in high temperature combustion environments. Experimental results on the decomposition of n-heptyl
S B. Kennedy, Ying Mei, R Gross, N Washburn, Eric J. Amis
Efforts in combinatorial materials science at NIST have evolved into three interwoven toolsets for exploring cell response to materials: material library
The geometric and surface features of a new NIST reference material, RM 8457 are presented. This reference material is composed of Ultra High Molecular Weight
David B. Newell, Edwin R. Williams, John A. Kramar, Jon R. Pratt, Douglas T. Smith
The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development
N. R. Washburn, S B. Kennedy, Carl Simon Jr., K Yamada, Eric J. Amis
The results of our investigation of cell proliferation on crystalline polymers will be presented. The goal of the research is to investigate how cells respond
Daniel Josell, S D. Kim, Daniel Wheeler, Thomas P. Moffat, S G. Pyo
This work presents the fundamentals for understanding the superconformal deposition observed during surfactant catalyzed chemical vapor deposition. The
The complexity of a semiconductor fabrication system is high because of complicated product flows, uncertain operation times, variable yields, changing products
N. K. Dhar, Y Chen, P M. Brill, Paul M. Amirtharaj, S Velicu, P Boieriu, Anthony G. Birdwell
Research on silicon based composite substrates is being conducted at the Army Research Laboratory. These substrates can be used to deposit HgCdTe alloys to
We discuss some of the complex issues associated with the metrology of molecular electronic devices and describe an electrical characterization method to assess
Richard A. Allen, Michael W. Cresswell, Loren W. Linholm
NIST is developing single-crystal reference materials for use as critical dimension (CD) calibration standards. In earlier work, these structures have been
Calibration with a relative intensity noise (RIN) standard significantly improves the RIN subtraction method for measuring the noise figure of an erbium-doped
We show how to implement an arbitrary two-qubit unitary operation using any of several quantum gate libraries with small a priori upper bounds on gate counts
This investigation compares the energy consumption ratings obtained for refrigerators using the Association of Home Appliance Manufacturers (AHAM) HRF-1 test
Xiaohong Gu, Li Piin Sung, D L. Ho, Chris A. Michaels, D Nguyen, Y C. Jean, Tinh Nguyen
The surface and interface of PVDF blended with different amounts of poly (methyl methacrylate) and poly (ethyl acrylate) copolymer (PNMA-co-PEA) have been
National metrology institutes around the world have embarked on an effort to compare their primary gas flow standards under the supervision of the Comit
A 35-kilowatt roof top photovoltaic system has been installed at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland. The system