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Conferences

Design and Performance of Capping Layers for EUV Multilayer Mirrors

June 1, 2003

Author(s)

Sasa Bajt, H N. Chapman, Nhan Nguyen, J Alameda, J C. Robinson, M Malinowski, E Gullikson, Andrew Aquila, Charles Tarrio, Steven Grantham

The reflectance stability of multilayer coatings for extreme ultraviolet lithography (EUVL) in a commercial tool environment is of utmost importance to ensure...

Precision Wavelength Metrology with a Fourier Transform Spectrometer

June 1, 2003

Author(s)

D. Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti

We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated...

Functional Tolerancing of a Gearbox

June 1, 2003

Author(s)

H Wang, Utpal Roy, Sudarsan Rachuri, Ram D. Sriram, Kevin W. Lyons

This paper proposes a scheme for the tolerance specification that uses the features? function information and mating condition attributes in the assembly to...

An Open Framework for the Assembly of Micro- and Nano-Scale Artifacts

June 1, 2003

Author(s)

Shaw C. Feng, Yung-Tsun Lee, Kevin W. Lyons

The design and manufacture of miniature devices have been increasing in both research laboratories and industry. The sizes of the devices continue to decrease...

A Product Information Modeling Framework For Product Lifecycle Management

June 1, 2003

Author(s)

Steven J. Fenves, Ram D. Sriram, Sudarsan Rachuri, Fujun Wang

We describe a framework for representing products based on the NIST Core Product Model (CPM) and its extensions, the Open Assembly Model (OAM), the Design...

Enhancing Virtual Product Representation for Advanced Design Repository Systems

June 1, 2003

Author(s)

Simon Szykman, Matt Bohm, RJ B. Stone

This paper describes the transformation of an existing set of heterogeneous product knowledge into a coherent design re-pository that supports product...

An Interface Data Model Supporting Manufacturing Simulation

June 1, 2003

Author(s)

Yung-Tsun Lee, Yan Luo, Charles R. McLean

Simulation technology is underutilized by the manufacturing industry. Standard data interfaces, among simulation modules or between simulation and other...

Assembly Simulation in the Design Process in a Distributed Environment

June 1, 2003

Author(s)

Charles R. McLean, Deogratias Kibira, William Reiter, Paul Maropoulos

Simulation technology i s applicable across a distributed enterprise in the pursuit of bringing high quality products to the market in minimum time. The...

Energy Distribution of Interface Traps in High-K Gated MOSFETs

June 1, 2003

Author(s)

Jin-Ping Han, Eric M. Vogel, Evgeni Gusev, C. D'Emic, Curt A. Richter, Da-Wei Heh, John S. Suehle

We use variable rise/fall-time charge pumping (CP) to determine the energy distribution of interface trap density (Dit) and capture cross-section of electrons...

Optical Phase-coherent Link Between an Optical Atomic Clock and 1550-nm Mode-locked Lasers

June 1, 2003

Author(s)

Kevin W. Holman, David J. Jones, Steven T. Cundiff, Jun Ye, John B. Schlager, Erich P. Ippen

We report the lowest timing jitter and tight optical phase coherence between 1550-nm mode-locked laser sources and an 800-nm femtosecond frequency comb serving...

Impact of Technical Noise on Supercontinuum Generation in Microstructure Fiber

June 1, 2003

Author(s)

Brian Washburn, Kristan L. Corwin, Nathan R. Newbury, R Windeler

The influence of the input laser technical noise on the noise of a generated supercontinuum is experimentally and numerically investigated. The supercontinuum...

Monitoring Polymer/Clay Nanocomposites Compounding Using a Dielectric Slit Die

May 30, 2003

Author(s)

Anthony J. Bur, S C. Roth, M M. McBrearty

A new in-line process monitoring instrument, a dielectric slit die, was used to examine compounding of polymer/clay nanocomposites. It is a multi-purpose...

Measuring the Invasiveness of High-Impedance Probes

May 14, 2003

Author(s)

Uwe Arz, Pavel Kabos, Dylan Williams

We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation...

Hierarachical Restoration Scheme for Multiple Failures in GMPLS Networks

May 12, 2003

Author(s)

Sanghun Lee, C Kim, David W. Griffith

It is expected that GMPLS-based recovery could become a viable option for obtaining faster restoration than layer 3 rerouting. Even though dedicated restoration...

Reactive Molecular Dynamics Model of Thermal Decomposition in Polymers

May 11, 2003

Author(s)

Stanislav I. Stoliarov, Marc R. Nyden, R E. Lyon

The application of quantum chemical and molecular simulation methods can reveal new insights into the thermal degradation chemistries of materials. This work...

Broadband Impedance Parameters of Asymmetric Coupled CMOS Interconnects: New Closed-Form Expressions and Comparison with Measurements

May 11, 2003

Author(s)

Uwe Arz, Dylan F. Williams, Dave K. Walker, Luoh A, Hartmut Grabinski, Andreas Weisshaary

New broadband closed-form expressions for the frequencydependent impedance parameters of asymmetric coupled coplanar interconnects on a conductive silicon...

Atomic vapor cells for miniature frequency references

May 8, 2003

Author(s)

Svenja A. Knappe, V. Velichansky, Hugh Robinson, Li-Anne Liew, John M. Moreland, John Kitching, Leo W. Hollberg

We report on the fabrication of millimeter-sized vapor cells and their performance on atomic clocks based on coherent population trapping (CPT). We discuss two...

Endcaps for TE01 Cavities in Fountain Frequency Standards

May 4, 2003

Author(s)

Neil Ashby, S Romisch, Steven R. Jefferts

Low Instability, Low Phase-Noise Femtosecond Optical Frequency Comb Microwave Synthesizer

May 4, 2003

Author(s)

T M. Ramond, A Bartels, Scott Diddams, Leo W. Hollberg, H Kurz

Ion Optical Clocks and Quantum Information Processing

May 1, 2003

Author(s)

David J. Wineland, James C. Bergquist, Till P. Rosenband, Piet Schmidt, Wayne M. Itano, John J. Bollinger, Dietrich G. Leibfried, W Oskay

We summarize experiments at NIST that (1) use guantum gates to entabgle ions and thereby improve the measurement signal-to-noise ratio in spectroscopy and (2)...

Adaptive Jitter Control for UPnP M-Search

May 1, 2003

Author(s)

Kevin L. Mills, Christopher E. Dabrowski

Selected service-discovery systems allow clients to issue multicast queries to locate network devices and services. Qualifying devices and services respond...

Authenticating Users on Handheld Devices

May 1, 2003

Author(s)

Wayne Jansen

Adequate user authentication is a persistent problem, particularly with handheld devices, which tend to be highly personal and at the fringes of an organization...

Developments toward an Autonomous Robotic Crane for Automated Steel Construction

May 1, 2003

Author(s)

Kamel S. Saidi, Alan M. Lytle, Nicholas A. Scott

The NIST Construction Metrology and Automation Group, in cooperation with the NIST Intelligent Systems Division, is researching robotic structural steel...

Numerical Analysis of a Coaxial Line With a Complex Gap Capacitance

May 1, 2003

Author(s)

Jan Obrzut, O Anopchenko

A full wave numerical analysis was performed for a coaxial line terminated by a complex gap capacitance. The scattering parameters, input impedance and the...

New Way of Handling Dimensional Measurement Results for Integrated Circuit Technology

May 1, 2003

Author(s)

Michael T. Postek, John S. Villarrubia, Andras Vladar

The international guidelines for correct expression of measurement results and errors call for a through assessment of the errors, their origin and behavior...

Multivariant Measurement for Thin Film Adhesion as a Function of Temperature and Thin Film Thickness

May 1, 2003

Author(s)

Martin Y. Chiang, R Song, Alamgir Karim, Eric J. Amis

The next generation of electronic components will require new low-k dielectrics or other novel thin films in the sub-micron level to be integrated into their...

Better Conformance Testing Through Automation: A Software-Based Approach to Creating Conformance Tests for W3C XML Schema

May 1, 2003

Author(s)

John M. Tebbutt

This paper describes our experiences in developing a highly configurable, extensible, component-based tool for the creation of conformance tests for XML...

Evaluating the Evaluation: A Case Study Using the TREC 2002 Question Answering Track

May 1, 2003

Author(s)

Ellen M. Voorhees

Evaluating competing technologies on a common problem set is a powerful way to improve the state of the art and hasten technology transfer. Yet poorly designed...

Network Provisioning as a Game Against Nature

May 1, 2003

Author(s)

Vladimir V. Marbukh

Traditional approaches to network provisioning assume availability of the reliable estimates for the expected demands. This assumption, however, oversimplifies...

On Shortest Random Walks under Adversarial Uncertainty

May 1, 2003

Author(s)

Vladimir V. Marbukh

Finding shortest feasible paths in a weighted graph has numerous applications including admission and routing in communication networks. This paper discusses a...

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